Polarizing white light interferometry for phase measurements using two simultaneous interferograms.

Our research introduces a design for a polarization phase-shifting white light interferometric system (PPS-WLIS) that operates in a transmissive mode for measuring the slope phase of transparent objects. It comprises a cyclic path interferometer (lateral shear interferometer) coupled with a multiplexing Michelson interferometer. The system uses polarization to produce two parallel interferograms with polarization modulated with relative shifts simultaneously. To determine the optical phase, we used a two-step algorithm for phase demodulation that does not necessitate precise phase shifts, making the system more straightforward to operate. As a result, we could observe variations in the object associated with optical phase changes. Furthermore, our method simplifies the phase-shift interferometry process by requiring only one capture, making it an effective way to examine objects at dynamic events. As an illustration, we demonstrated the temperature measurement generated by a section of a candle flame.

Dynamic parallel phase-shifting electronic speckle pattern interferometer.

Methods for measuring variations in diffuse surfaces using electronic speckle pattern interferometry (ESPI) are widely used and well known. In this research, we present an out-of-plane ESPI system coupled to a Michelson configuration to generate simultaneous parallel interferograms with different phase shifts. The system uses circular polarization states to generate parallel phase shifted interferograms. Due to the polarization states, the fringes do not experience a contrast reduction, thus avoiding measurement errors that affect spatial or temporal phase-shifting in interferometry. The basic operating principle of polarization modulation is described, and results that represent the temporal evolution of an aluminum plate are presented. The generation of two simultaneous patterns allows one to track the dynamic performance of the plate.

Phase stepping through polarizing modulation in electronic speckle pattern interferometry.

We have demonstrated a speckle out-of-plane interferometer that employs phase-stepping procedures by means of polarization modulation. The system generates circular polarization states with opposite signs at each arm of the system, which overlap at the output of the interferometer, to generate phase shifts operating a conventional linear polarizer; the emerging polarization states have been analyzed to obtain the shifts needed to process the optical phase. The phase-stepping technique is demonstrated with a two-step algorithm to measure out-of-plane displacement on a flat metal plate.

Parallel phase shifting radial shear interferometry with complex fringes and unknown phase shift.

We present an interferometric method to analyze transparent samples using complex fringes generated by a parallel phase shifting radial shear interferometer using two coupled interferometers. Parallel interferograms are generated using two interferometers: the first one generates the polarized base pattern, and the second system is used to generate parallel interferograms allowing the adjustment of the x-y positions of the parallel interferograms. To obtain the optical phase map, parallel phase shift is generated by collocating polarizing filters at the output of the system; the polarizers are placed at arbitrary angles since they do not require adjustment because of the phase-recovery algorithm. The optical phase was processed using a two-step algorithm based on a modified Gram-Schmidt orthogonalization method. Such an algorithm has the advantage of not being iterative and is robust to amplitude modulation. The proposed method reduces the number of captures needed in phase-shifting interferometry. We applied the developed system to examine static and dynamics phase objects.