ABSTRACT
For optimal sensitivity in electric field measurements, electro-optic (EO) crystals are typically selected based on their EO coefficients and dielectric constants. However, the conventional figure of merit yields sensitivity predictions regarding EO materials that are inconsistent with experimental data. In this Letter, we demonstrate that depolarization effects, which are often ignored, can dramatically enhance responsivity depending on the shape and orientation of the EO crystal. For optimal sensitivity, these effects are best exploited in longitudinal EO sensors, where they yield an optical modulation depth that increases quadratically with crystal length.
ABSTRACT
Electro-optic (EO) modulation devices, which utilize an external electric field to modulate a beam of optical radiation, are strongly affected by parasitic effects, which change the polarization state of the optical beam. As a result, very small changes in the birefringence or optical path length within the EO material can result in very large fluctuations of the amplitude and phase of the optical modulation signal. A method of actively analyzing the modulated beam is described and demonstrated, which eliminates these fluctuations and keeps the modulation device stably operating at its peak responsivity. Applications to electric field detection and measurements are discussed.
