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Opt Express ; 21(7): 8763-72, 2013 Apr 08.
Article in English | MEDLINE | ID: mdl-23571965

ABSTRACT

We have developed a new imaging method, ultrafast optical wide field microscopy, capable of rapidly acquiring wide field images of nearly any sample in a non-contact manner with high spatial and temporal resolution. Time-resolved images of the photoinduced changes in transmission for a patterned semiconductor thin film and a single silicon nanowire after optical excitation are captured using a two-dimensional smart pixel array detector. These images represent the time-dependent carrier dynamics with high sensitivity, femtosecond time resolution and sub-micrometer spatial resolution.


Subject(s)
Image Enhancement/instrumentation , Microscopy/instrumentation , Equipment Design , Equipment Failure Analysis
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