High Bragg reflectivity of diamond crystals exposed to multi-kW†mm-2 X-ray beams.

X-ray free-electron lasers in the oscillator configuration (XFELO) are future fully coherent hard X-rays sources with ultrahigh spectral purity. X-ray beams circulate in an XFELO optical cavity comprising diamond single crystals. They function as high-reflectance (close to 100%), narrowband (∼10 meV) Bragg backscattering mirrors. The average power density of the X-ray beams in the XFELO cavity is predicted to be as high as ∼10 kW mm-2. Therefore, XFELO feasibility relies on the ability of diamond crystals to withstand such a high radiation load and preserve their high reflectivity. Here the endurance of diamond crystals to irradiation with multi-kW mm-2 power density X-ray beams is studied. It is shown that the high Bragg reflectivity of the diamond crystals is preserved after the irradiation, provided it is performed at ∼1 × 10-8 Torr high-vacuum conditions. Irradiation under 4 × 10-6 Torr results in a ∼1 meV shift of the Bragg peak, which corresponds to a relative lattice distortion of 4 × 10-8, while the high Bragg reflectivity stays intact.

A rotational and axial motion system load frame insert for in situ high energy x-ray studies.

High energy x-ray characterization methods hold great potential for gaining insight into the behavior of materials and providing comparison datasets for the validation and development of mesoscale modeling tools. A suite of techniques have been developed by the x-ray community for characterizing the 3D structure and micromechanical state of polycrystalline materials; however, combining these techniques with in situ mechanical testing under well characterized and controlled boundary conditions has been challenging due to experimental design requirements, which demand new high-precision hardware as well as access to high-energy x-ray beamlines. We describe the design and performance of a load frame insert with a rotational and axial motion system that has been developed to meet these requirements. An example dataset from a deforming titanium alloy demonstrates the new capability.

Diffraction properties of multilayer Laue lenses with an aperture of 102 µm and WSi2/Al bilayers.

We report on the characterization of a multilayer Laue lens (MLL) with large acceptance, made of a novel WSi2/Al bilayer system. Fabrication of multilayers with large deposition thickness is required to obtain MLL structures with sufficient apertures capable of accepting the full lateral coherence length of x-rays at typical nanofocusing beamlines. To date, the total deposition thickness has been limited by stress-buildup in the multilayer. We were able to grow WSi2/Al with low grown-in stress, and asses the degree of stress reduction. X-ray diffraction experiments were conducted at beamline 1-BM at the Advanced Photon Source. We used monochromatic x-rays with a photon energy of 12 keV and a bandwidth of ΔE/E=5.4·10(-4). The MLL was grown with parallel layer interfaces, and was designed to have a large focal length of 9.6 mm. The mounted lens was 2.7 mm in width. We found and quantified kinks and bending of sections of the MLL. Sections with bending were found to partly have a systematic progression in the interface angles. We observed kinking in some, but not all, areas. The measurements are compared with dynamic diffraction calculations made with Coupled Wave Theory. Data are plotted showing the diffraction efficiency as a function of the external tilting angle of the entire mounted lens. This way of plotting the data was found to provide an overview into the diffraction properties of the whole lens, and enabled the following layer tilt analyses.

Hard x-ray monochromator with milli-electron volt bandwidth for high-resolution diffraction studies of diamond crystals.

We report on design and performance of a high-resolution x-ray monochromator with a spectral bandwidth of ΔE(X) ≃ 1.5 meV, which operates at x-ray energies in the vicinity of the backscattering (Bragg) energy E(H) = 13.903 keV of the (008) reflection in diamond. The monochromator is utilized for high-energy-resolution diffraction characterization of diamond crystals as elements of advanced x-ray crystal optics for synchrotrons and x-ray free-electron lasers. The monochromator and the related controls are made portable such that they can be installed and operated at any appropriate synchrotron beamline equipped with a pre-monochromator.

Nanoradian angular stabilization of x-ray optical components.

An x-ray free-electron laser oscillator (XFELO) has been recently proposed [K. Kim et al., Phys. Rev. Lett. 100, 244802 (2008)]. Angular orientation and position in space of Bragg mirrors of the XFELO optical cavity must be continuously adjusted to compensate for the instabilities and maximize the output intensity. An angular stability of about 10 nrad (rms) is required [K. Kim and Y. Shvyd'ko, Phys. Rev. ST Accel. Beams 12, 030703 (2009)]. To approach this goal, a feedback loop based on a null-detection principle was designed and used for stabilization of a high-energy-resolution x-ray monochromator (DeltaE/E approximately 4 x 10(-8), E=23.7 keV) and a high-heat-load monochromator. Angular stability of about 13 nrad (rms) has been demonstrated for x-ray optical elements of the monochromators.