1.
J Microsc
; 223(Pt 2): 140-9, 2006 Aug.
Article
in English
| MEDLINE
| ID: mdl-16911074
ABSTRACT
We have developed an instrument control and image acquisition system for use with scanning electron microscopes. By making the system flexible over a wide range of operating voltages, scan generation and image acquisition modes can be easily accommodated to a wide range of instruments. We show the implementation of this system for use with a custom-built low-voltage scanning electron microscope. We then explore the simple modifications that are required for control of two instruments intended for use as free electron lasers.