Modelling Polarization Effects in a CdZnTe Sensor at Low Bias.

Semi-insulating CdTe and CdZnTe crystals fabricated into pixelated sensors and integrated into radiation detection modules have demonstrated a remarkable ability to operate under rapidly changing X-ray irradiation environments. Such challenging conditions are required by all photon-counting-based applications, including medical computed tomography (CT), airport scanners, and non-destructive testing (NDT). Although, maximum flux rates and operating conditions differ in each case. In this paper, we investigated the possibility of using the detector under high-flux X-ray irradiation with a low electric field satisfactory for maintaining good counting operation. We numerically simulated electric field profiles visualized via Pockels effect measurement in a detector affected by high-flux polarization. Solving coupled drift-diffusion and Poisson's equations, we defined the defect model, consistently depicting polarization. Subsequently, we simulated the charge transport and evaluated the collected charge, including the construction of an X-ray spectrum on a commercial 2-mm-thick pixelated CdZnTe detector with 330 µm pixel pitch used in spectral CT applications. We analyzed the effect of allied electronics on the quality of the spectrum and suggested setup optimization to improve the shape of the spectrum.

Optimization of quasi-hemispherical CdZnTe detectors by means of first principles simulation.

In this paper we present the development of quasi-hemispherical gamma-ray detectors based on CdZnTe. Among the possible single-polarity electrode configurations, such as coplanar, pixelated, or virtual Frisch-grid geometries, quasi-hemispherical detectors are the most cost-effective alternative with comparable raw energy resolution in the high and low energy range. The optimal configuration of the sensor in terms of dimension of the crystals and electrode specifications has been first determined by simulations, and successively validated with experimental measures. Spectra from different sources have been acquired to evaluate the detectors performances. Three types of detectors with different CZT volumes have been fabricated, namely 10 × 10 × 5 mm3, 15 × 15 × 10 mm3 and 20 × 20 × 10 mm3. In the case of 10 × 10 × 5 mm3 crystals, the optimum pixel size determined by our simulation tool was confirmed by experiments: the best spectroscopic resolution of 1.3% at 662 keV has been found for a 750 µm diameter pixel detector. The best energy resolution values obtained for the 15 × 15 × 10 mm3 and 20 × 20 × 10 mm3 detectors were respectively 1.7% and 2.7% at 662 keV.

Spectral Dependence of the Photoplastic Effect in CdZnTe and CdZnTeSe.

We studied the spectral dependence of the Vickers microhardness HV0.025 of CdZnTe and CdZnTeSe samples upon illumination and found out that it increases over the entire applied spectral range of 1540-750 nm. We also found out that the photoconductivity and microhardness are correlated. We observed changes in the correlation diagram (change of slope and an abrupt change of HV0.025 at several wavelengths of the illuminating light). Based on measurements of the relative changes of the space charge upon illumination using the Pockels effect, we suggest that the observed spectral dependence of positive photoplastic effect in CdZnTe and CdZnTeSe can be explained by the trapping of photoinduced electrons and holes, which affects the motion of the partial dislocations. The underlying physical explanation relies on the assumption that reconstructed bonds break before dislocation glide.

In and Al Schottky Contacts Comparison on P-Type Chlorine-Doped CdTe.

The performance of the CdTe radiation detectors heavily relies on the method of contact preparation. A convenient research method addressing this problem is the laser-induced transient current technique. In this paper, we compare the performance of two CdTe crystals which underwent different metallization processes. We showed that appropriately designed Au/Al contacts induce much less bulk polarization than commercial Pt/In electrodes under the same working conditions and can thus provide a convenient alternative to the industry standard. The comparison was based on the monitoring of the time-dependent sensor polarization measuring transient currents excited by above-bandgap laser illumination complemented by the Am 241 gamma spectroscopy. The theoretical analysis of current waveforms and radiation spectra enabled us to determine the charge carrier mobility, mobility-lifetime products of electrons and holes, and temporal and bias dependence of the space charge formation.

Low-Temperature Annealing of CdZnTeSe under Bias.

We performed a gradual low-temperature annealing up to 360 K on a CdZnTeSe radiation detector equipped with gold and indium electrodes under bias at both polarities. We observed significant changes in the detector's resistance and space-charge accumulation. This could potentially lead to the control and improvement of the electronic properties of the detector because the changes are accompanied with the reduction in the bulk dark current and surface leakage current. In this article, we present the results of a detailed study of the internal electric field and conductivity changes in CdZnTeSe detector for various annealing steps under bias taking into account different polarities during annealing and subsequent characterization. We observed that low-temperature annealing results in an increase in the barrier height at the contacts that, in general, reduces the dark current and decreases the positive space charge present in the sample compared to the pre-annealed condition.

Deciphering the effect of traps on electronic charge transport properties of methylammonium lead tribromide perovskite.

Halide perovskites have undergone remarkable developments as highly efficient optoelectronic materials for a variety of applications. Several studies indicated the critical role of defects on the performance of perovskite devices. However, the parameters of defects and their interplay with free charge carriers remain unclear. In this study, we explored the dynamics of free holes in methylammonium lead tribromide (MAPbBr3) single crystals using the time-of-flight (ToF) current spectroscopy. By combining ToF spectroscopy and Monte Carlo simulation, three energy states were detected in the bandgap of MAPbBr3 In addition, we found the trapping and detrapping rates of free holes ranging from a few microseconds to hundreds of microseconds. Contrary to previous studies, we revealed a strong detrapping activity of traps. We showed that these traps substantially affect the transport properties of MAPbBr3, including mobility and mobility-lifetime product. Our results provide an insight on charge transport properties of perovskite semiconductors.

Influence of Surface and Bulk Defects on Contactless Resistivity Measurements of CdTe and Related Compounds.

We analyzed the influence of parameters of deep levels in the bulk and conditions on the surface on transient charge responses of semi-insulating samples (CdTe and GaAs). We studied the dependence on the applied bias step used for the experimental evaluation of resistivity in contactless measurement setups. We used simulations based on simultaneous solutions of 1D drift diffusion and Poisson's equations as the main investigation tool. We found out that the resistivity can be reliably determined by the transient contactless method in materials with a large density of deep levels in the bulk (e.g., semi-insulating GaAs) when the response curve is described by a single exponential. In contrast, the materials with the low deep-level density, like semiconductor radiation detector materials (e.g., CdTe, CdZnTe, etc.), usually exhibit a complex response to applied bias, depending on the surface conditions. We show that a single exponential fit does not represent the true relaxation time and resistivity, in this case. A two-exponential fit can be used for a rough estimate of bulk material resistivity only in a limit of low-applied bias, when the response curve approaches a single-exponential shape. A decreasing of the bias leads to a substantially improved agreement between the evaluated and true relaxation time, which is also consistent with the approaching of the relaxation curve to the single-exponential shape.

Charge Sharing in (CdZn)Te Pixel Detector Characterized by Laser-Induced Transient Currents.

Performance of the (CdZn)Te pixelated detectors heavily relies on the quality of the underlying material. Modern laser-induced transient current technique addresses this problem as a convenient tool for characterizing the associated charge distribution. In this paper, we investigated the charge sharing phenomenon in (CdZn)Te pixel detector as a function of the charge collected on adjacent pixels. The current transients were generated in the defined 4 mm2 spots using 660 nm laser illumination. Waveforms measured on the pixel of interest and its surroundings were used to build the maps of the collected charge at different biases. The detailed study of the maps allowed us to distinguish the charge sharing region, the region with a defect, and the finest part in terms of the performance part of the pixelated anode. We observed the principal inhomogeneity complicating the assignment of the illuminated spot to the nearest pixel.