Charge carrier transport and digital data transmission performance in sub-20 nm diameter indium antimonide nanowires.

We investigated the data transmission performance of indium antimonide (InSb) nanowires synthesized on (100) type substrates using chemical vapor deposition and having diameters of 20 nm and below using the eye diagram approach of the transmission line. NW interconnect parameters including the bit error rate, quality factor, signal attenuation and maximum bandwidth have been extracted. Nanowires can sustain data rates of up to 10 mega bits per second (Mbps) without any impedance matching and de-embedding of the parasitic parameters coming from the measurement system, and the data rate is directly proportional to nanowire diameter.

Centimeter-scale high-resolution metrology of entire CVD-grown graphene sheets.

A high-throughput metrology method for measuring the thickness and uniformity of entire large-area chemical vapor deposition-grown graphene sheets on arbitrary substrates is demonstrated. This method utilizes the quenching of fluorescence by graphene via resonant energy transfer to increase the visibility of graphene on a glass substrate. Fluorescence quenching is visualized by spin-coating a solution of polymer mixed with fluorescent dye onto the graphene then viewing the sample under a fluorescence microscope. A large-area fluorescence montage image of the dyed graphene sample is collected and processed to identify the graphene and indicate the graphene layer thickness throughout the entire graphene sample. Using this metrology method, the effect of different transfer techniques on the quality of the graphene sheet is studied. It is shown that small-area characterization is insufficient to truly evaluate the effect of the transfer technique on the graphene sample. The results indicate that introducing a drop of acetone or liquid poly(methyl methacrylate) (PMMA) on top of the transfer PMMA layer before soaking the graphene sample in acetone improves the quality of the graphene dramatically over immediately soaking the graphene in acetone. This work introduces a new method for graphene quantification that can quickly and easily identify graphene layers in a large area on arbitrary substrates. This metrology technique is well suited for many industrial applications due to its repeatability and flexibility.