Quantitative comparison of plasmon resonances and field enhancements of near-field optical antennae using FDTD simulations.

Plasmon resonances and electric field enhancements of several near-field optical antennae with plasmonic nanostructures engineered at their apices were quantitatively compared using finite difference time domain simulations. Although many probe designs have been tested experimentally, a systematic comparison of field enhancements has not been possible, due to differences in instrument configuration, reporter mechanism, excitation energy, and plasmonic materials used. For plasmonic nanostructures attached to a non-plasmonic support (e.g., a nanoparticle functionalized AFM tip), we find that the complex refractive index of the support material is critical in controlling the overall plasmonic behavior of the antenna. Supports with strong absorption at optical energies (Pt, W) dampen plasmon resonances and lead to lower enhancements, while those with low absorption (SiO2, Si3N4, Si) boost enhancement by increasing the extinction cross-section of the apex nanostructure. Using a set of physically realistic constraints, probes were optimized for peak plasmonic enhancement at common near-field optical wavelengths (633-647 nm) and those with focused ion-beam milled grooves near the apex were found to give the largest local field enhancements (~30x). Compared to unstructured metal cones, grooved probes gave a 300% improvement in field strength, which can boost tip-enhanced Raman spectroscopy (TERS) signals by 1-2 orders of magnitude. Moreover, grooved probe resonances can be easily tuned over visible and near-infrared energies by varying the plasmonic metal (Ag or Au) and groove location. Overall, this work shows that probes with strong localized surface plasmon resonances at their apices can be engineered to provide large field enhancements and boost signals in near-field optical experiments.

Nanoscale Optical Microscopy and Spectroscopy Using Near-Field Probes.

Light-matter interactions can provide a wealth of detailed information about the structural, electronic, optical, and chemical properties of materials through various excitation and scattering processes that occur over different length, energy, and timescales. Unfortunately, the wavelike nature of light limits the achievable spatial resolution for interrogation and imaging of materials to roughly λ/2 because of diffraction. Scanning near-field optical microscopy (SNOM) breaks this diffraction limit by coupling light to nanostructures that are specifically designed to manipulate, enhance, and/or extract optical signals from very small regions of space. Progress in the SNOM field over the past 30 years has led to the development of many methods to optically characterize materials at lateral spatial resolutions well below 100 nm. We review these exciting developments and demonstrate how SNOM is truly extending optical imaging and spectroscopy to the nanoscale.