ABSTRACT
We have observed an aggregation of carbon or carbon derivatives on platinum and natively oxidized silicon surfaces during STM measurements in ultra-high vacuum on solvent-cleaned samples previously structured by e-beam lithography. We imaged the aggregated layer with scanning tunneling microscopy (STM) as well as scanning electron microscopy (SEM). The amount of the aggregated material increases with the number of STM scans and with the tunneling voltage. Film thicknesses of up to 10 nm with five successive STM measurements of the same area have been obtained.
ABSTRACT
The spatial orientation and magnitude of forces acting between the tip atoms of an atomic force microscope tip and the surface atoms of an atomically clean surface can be determined by force field measurements. We compare two force-vector fields obtained along and between the ionic lattice sites of a KBr(001) surface with atomistic simulations for two differently configured tips. This careful analysis allows us to identify the K(+)-termination of the tip apex as well as the polarity of the KBr lattice.
ABSTRACT
The magnitude and direction of forces acting between individual atoms as a function of their relative position can be described by atomic-scale force-vector fields. We present a noncontact atomic force microscopy based determination of the force fields between an atomically sharp tip and the (001) surface of a KBr crystal in conjunction with atomistic simulations. The direct overlap of experiment and simulation allows identification of the frontmost tip atom and of the surface sublattices. Superposition of vertical and lateral forces reveals the spatial orientation of the interatomic force vectors.
ABSTRACT
Recent advances in dynamic force microscopy show that it is possible to measure the forces between atomically sharp tips and particular atomic positions on surfaces as a function of distance. However, on most ionic surfaces, the positive and negative ions can so far not be distinguished. In this paper, we use the CaF2(111) surface, where atomic resolution force microscopy has allowed identification of the positions of the Ca2+ and F- ions in the obtained images, to demonstrate that short-range interaction forces can be measured selectively above chemically identified surface sites. Combining experimental and theoretical results allows a quantification of the strength and distance dependence of the interaction of a tip-terminating cluster with particular surface ions and reveals details of cluster and surface relaxation. Further development of this approach will provide new insight into mechanisms of chemical bond formation between clusters, cluster deposition at surfaces, processes in adhesion and tribology, and single atom manipulation with the force microscope.
