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1.
Ultramicroscopy ; 231: 113264, 2021 Dec.
Article in English | MEDLINE | ID: mdl-33902952

ABSTRACT

Inline electron holography, the recovery of amplitude and phase of an electron wave function having passed through a thin specimen from a focal series recorded in a transmission electron microscope is being applied in many labs worldwide. At medium range magnification (i.e. typically ≥0.8 nm where the lattice of small unit cell crystals such as silicon is not resolved), where the defocus needs to be varied over a rather large range of several hundred nm or even µm, the retrieval of low spatial frequency information is severely affected by the choice of experimental parameters as well as the way of data normalization. Methods to quantitatively analyze the reliability of phase maps obtained by inline electron holography are presented, and data recorded and processed in different ways are compared. While, even under optimized conditions, the phase reconstructed from an experimental focal series still lacks very low spatial frequency components, regularization schemes exist and are demonstrated to effectively hide artifacts associated with this lack of information.

2.
J Am Chem Soc ; 142(30): 12976-12986, 2020 07 29.
Article in English | MEDLINE | ID: mdl-32597176

ABSTRACT

Covalent triazine frameworks are an emerging material class that have shown promising performance for a range of applications. In this work, we report on a metal-assisted and solvent-mediated reaction between calcium carbide and cyanuric chloride, as cheap and commercially available precursors, to synthesize two-dimensional triazine structures (2DTSs). The reaction between the solvent, dimethylformamide, and cyanuric chloride was promoted by calcium carbide and resulted in dimethylamino-s-triazine intermediates, which in turn undergo nucleophilic substitutions. This reaction was directed into two dimensions by calcium ions derived from calcium carbide and induced the formation of 2DTSs. The role of calcium ions to direct the two-dimensionality of the final structure was simulated using DFT and further proven by synthesizing molecular intermediates. The water content of the reaction medium was found to be a crucial factor that affected the structure of the products dramatically. While 2DTSs were obtained under anhydrous conditions, a mixture of graphitic material/2DTSs or only graphitic material (GM) was obtained in aqueous solutions. Due to the straightforward and gram-scale synthesis of 2DTSs, as well as their photothermal and photodynamic properties, they are promising materials for a wide range of future applications, including bacteria and virus incapacitation.

3.
Opt Express ; 26(9): 11819-11833, 2018 Apr 30.
Article in English | MEDLINE | ID: mdl-29716099

ABSTRACT

The transport of intensity equation (TIE) relates the variation of intensity of a wave-front along its mean direction of propagation with its phase. In experimental application, characteristic artefacts may affect the retrieved phase. These originate from inadequacies in estimating the axial derivative and the amplification of noise in the inversion of the TIE. To tackle these issues, images recorded at multiple planes of focus can be integrated into a multi-focus TIE (MFTIE) solution. This methodology relies on the efficient sampling of phase information in the spatial-frequency domain, typically by the definition of band pass filters implemented as a progression of sharp spatial frequency cut-offs. We present a convenient MFTIE implementation which avoids the need for recording images at very specific planes of focus and applies overlapping cut-offs, greatly simplifying the experimental application. This new approach additionally also accounts for partial spatial coherence in a flux-preserving framework. Using simulated data as well as experimental data from optical microscopy and electron microscopy we show that the frequency response of this MFTIE algorithm recovers efficiently a wide range of spatial frequencies of the phase that can be further extended by simple iterative refinement.

4.
Ultramicroscopy ; 184(Pt B): 98-105, 2018 Jan.
Article in English | MEDLINE | ID: mdl-29102829

ABSTRACT

Electron energy-loss spectroscopy and energy-dispersive X-ray spectroscopy are two of the most common means for chemical analysis in the scanning transmission electron microscope. The marked progress of the instrumentation hardware has made chemical analysis at atomic resolution readily possible nowadays. However, the acquisition and interpretation of atomically resolved spectra can still be problematic due to image distortions and poor signal-to-noise ratio of the spectra, especially for investigation of energy-loss near-edge fine structures. By combining multi-frame spectrum imaging and automatic energy-offset correction, we developed a spectrum imaging technique implemented into customized DigitalMicrograph scripts for suppressing image distortions and improving the signal-to-noise ratio. With practical examples, i.e. SrTiO3 bulk material and Sr-doped La2CuO4 superlattices, we demonstrate the improvement of elemental mapping and the EELS spectrum quality, which opens up new possibilities for atomically resolved EELS fine structure mapping.

5.
Adv Mater ; 27(33): 4845-50, 2015 Sep 02.
Article in English | MEDLINE | ID: mdl-26178685

ABSTRACT

Semipolar {101¯1} InGaN quantum wells are grown on (001) Si substrates with an Al-free buffer and wafer-scale uniformity. The novel structure is achieved by a bottom-up nano-heteroepitaxy employing self-organized ZnO nanorods as the strain-relieving layer. This ZnO nanostructure unlocks the problems encountered by the conventional AlN-based buffer, which grows slowly and contaminates the growth chamber.


Subject(s)
Gallium/chemistry , Nanotechnology/methods , Nanotubes/chemistry , Silicon/chemistry , Electrical Equipment and Supplies , Nanotechnology/instrumentation
6.
Nanotechnology ; 24(4): 045601, 2013 Feb 01.
Article in English | MEDLINE | ID: mdl-23291468

ABSTRACT

Well-controlled growth of Ag nanoparticles (NPs) on Si substrates is important for next generation Si-based optoelectronic devices, but only randomly oriented Ag NPs have been previously reported. In this work, well-oriented Ag NPs with regular shapes are pseudomorphically grown on Si(100) and Si(111) substrates with crystallographic relationships of {100} mathematical left angle bracket 010 mathematical right angle bracket Ag ∥ {100} mathematical left angle bracket 010 mathematical right angle bracket Si and {111} mathematical left angle bracket 110 mathematical right angle bracket Ag ∥ {111} mathematical left angle bracket 110 mathematical right angle bracket Si, respectively. From a cross-sectional image, the Ag NPs on Si(100) substrates penetrate into Si and generate an inverted pyramid-like structure terminated by {111} planes embedded in Si substrates. In contrast, the Ag NPs on Si(111) substrates show flat morphology with the top plane terminated by Ag {111}. The Si underneath Ag NPs was not penetrated by Ag and a SiO(2) layer was formed between Ag and Si. Photoluminescence spectra of the Ag NPs show ultraviolet emissions centered in the 340-343 nm range. The mathematical left angle bracket 111 mathematical right angle bracket-oriented Ag particles show stronger emissions with an extra peak at 343 nm compared with mathematical left angle bracket 100 mathematical right angle bracket-oriented Ag NPs. Raman spectra show that the mathematical left angle bracket 100 mathematical right angle bracket - and mathematical left angle bracket 111 mathematical right angle bracket-oriented Ag NPs can enhance the peak intensity of Si(100) and Si(111) by 45.3% and 32.5%, respectively. The orientation-controlled Ag NPs with anisotropic optical properties are promising materials for Si-based optoelectronics.


Subject(s)
Crystallization/methods , Metal Nanoparticles/chemistry , Silicon/chemistry , Silver/chemistry , Adsorption , Light , Materials Testing , Metal Nanoparticles/radiation effects , Molecular Conformation/radiation effects , Particle Size , Refractometry , Scattering, Radiation , Silver/radiation effects , Surface Properties/radiation effects
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