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1.
Appl Opt ; 62(7): B35-B42, 2023 Mar 01.
Article in English | MEDLINE | ID: mdl-37132884

ABSTRACT

A post-production characterization approach based on spectral photometric and ellipsometric data related to a specially prepared set of samples is proposed. Single-layer (SL) and multilayer (ML) sets of samples presenting building blocks of the final sample were measured ex-situ, and reliable thicknesses and refractive indices of the final ML were determined. Different characterization strategies based on ex-situ measurements of the final ML sample were tried, reliability of their results was compared, and the best characterization approach for practical use, when preparation of the mentioned set of samples would be a luxury, is proposed.

2.
Opt Lett ; 47(6): 1367-1370, 2022 Mar 15.
Article in English | MEDLINE | ID: mdl-35290315

ABSTRACT

Glass is important as a substrate for coatings in a wide range of applications or as a substrate for the fabrication of optical micro/nano structures. Coating by wet chemistry methods often demands modifications of the glass surface properties involving several steps. In addition, the micro/nano structuring is usually a several-step process. New methods that are simpler and more efficient are being proposed. One of them is glass poling that has been used to obtain surface relief on glass and, together with electric field assisted dissolution, for metal nanostructures in glass/metal systems. In this work, we demonstrate that poling increases the susceptibility of the glass surface for coating with Ag nanoparticles synthesized in situ by silver salt reduction. It is shown that a selectively poled glass surface can be used as a template to obtain optical microstructures consisting of Ag nanoparticles in only three simple steps. As a proof-of-concept, the method is used to fabricate diffraction gratings with an optical response that can be tuned by adjusting the Ag concentration. This approach is more versatile than the standard structuring by electric field assisted dissolution, as it does not require application of an elevated temperature once the coating is formed, which might change or destroy the properties of the thermally sensitive coating species or morphologies.

3.
Opt Express ; 20(14): 16129-44, 2012 Jul 02.
Article in English | MEDLINE | ID: mdl-22772303

ABSTRACT

We explain reasons of oscillations frequently observed in total losses spectra (1 - R - T) calculated on the basis of measurement spectral photometric data of thin film samples. The first reason of oscillations is related to difference in angles of incidence at which spectral transmittance and reflectance are measured. The second reason is an absorption in a thin film. The third reason is a slight thickness non-uniformity of the film. We observe a good agreement between theoretical models and corresponding measurements, which proves above statements on the origins of oscillations in total losses.

4.
Appl Opt ; 51(2): 245-54, 2012 Jan 10.
Article in English | MEDLINE | ID: mdl-22270522

ABSTRACT

We perform characterization of thin films and reverse engineering of multilayer coatings on the basis of multiangle spectral photometric data provided by a new advanced spectrophotometer accessory. Experimental samples of single thin films and multilayer coatings are produced by magnetron sputtering and electron-beam evaporation. Reflectance and transmittance data at two polarization states are measured at incidence angles from 7 to 40 deg. We demonstrate that multiangle reflectance and transmittance data provide reliable characterization and reverse-engineering results.

5.
Appl Opt ; 50(33): 6189-97, 2011 Nov 20.
Article in English | MEDLINE | ID: mdl-22108876

ABSTRACT

In the present study we determine the optical parameters of thin metal-dielectric films using two different characterization techniques based on nonparametric and multiple oscillator models. We consider four series of thin metal-dielectric films produced under various deposition conditions with different optical properties. We compare characterization results obtained by nonparametric and multiple oscillator techniques and demonstrate that the results are consistent. The consistency of the results proves their reliability.

6.
Appl Opt ; 50(10): 1453-64, 2011 Apr 01.
Article in English | MEDLINE | ID: mdl-21460914

ABSTRACT

Optical constants of thin metal films are strongly dependent on deposition conditions, growth mode, and thickness. We propose a universal characterization approach that allows reliable determination of thin metal film optical constants as functions of wavelength and thickness. We apply this approach to determination of refractive index dispersion of silver island films embedded between silica layers.

7.
Appl Opt ; 50(9): C228-31, 2011 Mar 20.
Article in English | MEDLINE | ID: mdl-21460943

ABSTRACT

Metal island films show a characteristic absorption peak related to the surface plasmon resonance of free electrons. This kind of film can be used in absorbing coatings, together with dielectric layers. Such absorbing multilayer coatings, with and without the gradient of the silver mass thickness in metal island films throughout the coating, have been deposited by electron beam evaporation. It is shown experimentally that coatings with a gradient in the mass thickness of silver nanoparticles have higher absorption than equivalent nongradient coatings with the same total mass thickness of silver nanoparticles.

8.
Opt Express ; 19(25): 25521-7, 2011 Dec 05.
Article in English | MEDLINE | ID: mdl-22273945

ABSTRACT

Optical properties of metal island films (MIFs) can be combined with interference of dielectric coatings. A set of multilayer designs containing metal clusters reflecting different colours from front and back side of the coating was obtained by numerical optimization. The chosen designs presenting the range of feasible colours were deposited by electron beam evaporation. Spectrophotometric and ellipsometric measurements verified that the produced coatings present an excellent agreement with the optical performance calculated from the designs. Numerical optimization was verified as a useful method in designing of coatings containing MIFs. This approach can ease the implementation of metal clusters into multilayer designs and broaden the applications of MIFs.


Subject(s)
Color , Gold/chemistry , Membranes, Artificial , Photometry/methods , Surface Plasmon Resonance/methods , Materials Testing
9.
Opt Express ; 18(26): 26915-28, 2010 Dec 20.
Article in English | MEDLINE | ID: mdl-21196968

ABSTRACT

The potential of random metal-dielectric nanocomposites as constituent elements of metamaterial structures is explored. Classical effective medium theories indicate that these composites can provide a tunable negative dielectric function with small absorption losses. However, the tuning potential of real random composites is significantly lower than the one predicted by classical theories, due to the underestimation of the spectral range where topological resonances take place. This result suggests that a random mixture consisting of a metal matrix with embedded isolated dielectric inclusions is a promising design guideline for the fabrication of tunable composites for metamaterial purposes.


Subject(s)
Metals/chemistry , Nanostructures/chemistry , Refractometry/instrumentation , Computer-Aided Design , Equipment Design , Equipment Failure Analysis , Light , Scattering, Radiation
10.
Appl Opt ; 46(24): 6084-91, 2007 Aug 20.
Article in English | MEDLINE | ID: mdl-17712371

ABSTRACT

A hybrid antireflective coating combining homogeneous layers and linear gradient refractive index layers has been deposited using different techniques. The samples were analyzed optically based on spectrophotometric and spectroscopic ellipsometry measurements under different angles of incidence in order to precisely characterize the coatings. The Lorentz-Lorenz model has been used to calculate the refractive index of material mixtures in gradient and constant index layers of the coating. The obtained refractive index profiles have been compared with the targeted ones to detect errors in processes of deposition.

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