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1.
J Contemp Dent Pract ; 14(1): 149-52, 2013 Jan 01.
Article in English | MEDLINE | ID: mdl-23579914

ABSTRACT

Cleaning and shaping are important steps in the root canal treatment. Despite the technological advances in endodontics, K and Hedstroen files are still widely used. In an attempt to be more effective in preparing the root canals, faster and more cutting efficient kinematic, alloys and design alternatives utilizing mechanically oscillating or rotary files are proposed. Even with all these technological innovating alternatives, the preparation of root canals remains a challenge.


Subject(s)
Root Canal Preparation/instrumentation , Dental Alloys/chemistry , Equipment Design , Humans , Root Canal Preparation/methods , Rotation , Technology, Dental
2.
Braz. oral res ; 26(4): 323-329, July-Aug. 2012. ilus, tab
Article in English | LILACS | ID: lil-640717

ABSTRACT

Dentin wall structural changes caused by 810-nm-diode laser irradiation can influence the sealing ability of endodontic sealers. The objective of this study was to evaluate the apical leakage of AH Plus and RealSeal resin-based sealers with and without prior diode laser irradiation. Fifty-two single-rooted mandibular premolars were prepared and divided into 4 groups, according to the endodontic sealer used and the use or non-use of laser irradiation. The protocol for laser irradiation was 2.5W, continuous wave in scanning mode, with 4 exposures per tooth. After sample preparation, apical leakage of 50% ammoniacal silver nitrate impregnation was analyzed. When the teeth were not exposed to irradiation, the RealSeal sealer achieved the highest scores, showing the least leakage, with significant differences at the 5% level (Kruskal-Wallis test, p = 0.0004), compared with AH Plus. When the teeth were exposed to the 810-nm-diode laser irradiation, the sealing ability of AH Plus sealer was improved (p = 0282). In the RealSeal groups, the intracanal laser irradiation did not interfere with the leakage index, showing similar results in the GRS and GRSd groups (p = 0.1009).


Subject(s)
Humans , Dental Leakage , Lasers, Semiconductor , Root Canal Filling Materials/radiation effects , Dentin/chemistry , Dentin/radiation effects , Epoxy Resins/chemistry , Epoxy Resins/radiation effects , Microscopy, Electron, Scanning , Random Allocation , Root Canal Filling Materials/chemistry , Root Canal Obturation/methods , Statistics, Nonparametric , Surface Properties
3.
Braz Oral Res ; 26(4): 323-9, 2012.
Article in English | MEDLINE | ID: mdl-22714928

ABSTRACT

Dentin wall structural changes caused by 810-nm-diode laser irradiation can influence the sealing ability of endodontic sealers. The objective of this study was to evaluate the apical leakage of AH Plus and RealSeal resin-based sealers with and without prior diode laser irradiation. Fifty-two single-rooted mandibular premolars were prepared and divided into 4 groups, according to the endodontic sealer used and the use or non-use of laser irradiation. The protocol for laser irradiation was 2.5W, continuous wave in scanning mode, with 4 exposures per tooth. After sample preparation, apical leakage of 50% ammoniacal silver nitrate impregnation was analyzed. When the teeth were not exposed to irradiation, the RealSeal sealer achieved the highest scores, showing the least leakage, with significant differences at the 5% level (Kruskal-Wallis test, p = 0.0004), compared with AH Plus. When the teeth were exposed to the 810-nm-diode laser irradiation, the sealing ability of AH Plus sealer was improved (p = 0282). In the RealSeal groups, the intracanal laser irradiation did not interfere with the leakage index, showing similar results in the GRS and GRSd groups (p = 0.1009).


Subject(s)
Dental Leakage , Lasers, Semiconductor , Root Canal Filling Materials/radiation effects , Dentin/chemistry , Dentin/radiation effects , Epoxy Resins/chemistry , Epoxy Resins/radiation effects , Humans , Microscopy, Electron, Scanning , Random Allocation , Root Canal Filling Materials/chemistry , Root Canal Obturation/methods , Statistics, Nonparametric , Surface Properties
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