ABSTRACT
We report the CsPbI3 random lasing at room temperature fabricated by a chemical deposition method. The CsPbI3 thin films with high crystalline quality have intense PL emission and easily achieve the lasing behavior with the Q-factor value over 7000. The lasing behavior of CsPbI3 thin films can be classified as random lasing by measuring lasing spectra at different collective angles. The fast Fourier transform analysis of the lasing spectra is employed to determine the effective cavity length. Most important of all, the lasing stability investigation shows the prolonged lasing stability over 4.8 X 105 laser shots in air.
ABSTRACT
The multifunctional hard X-ray nanoprobe at Taiwan Photon Source (TPS) exhibits the excellent ability to simultaneously characterize the X-ray absorption, X-ray excited optical luminescence (XEOL) as well as the dynamics of XEOL of materials. Combining the scanning electron microscope (SEM) into the TPS 23A end-station, we can easily and quickly measure the optical properties to map out the morphology of a ZnO microrod. A special phenomenon has been observed that the oscillations in the XEOL associated with the confinement of the optical photons in the single ZnO microrod shows dramatical increase while the X-ray excitation energy is set across the Zn K-edge. Besides having the nano-scale spatial resolution, the synchrotron source also gives a good temporal domain measurement to investigate the luminescence dynamic process. The decay lifetimes of different emission wavelengths and can be simultaneously obtained from the streak image. Besides, SEM can provide the cathodoluminescence (CL) to be a complementary method to analyze the emission properties of materials, we anticipate that the X-ray nanoprobe will open new avenues with great characterization ability for developing nano/microsized optoelectronic devices.
