Torsional force microscopy of van der Waals moirés and atomic lattices.

In a stack of atomically thin van der Waals layers, introducing interlayer twist creates a moiré superlattice whose period is a function of twist angle. Changes in that twist angle of even hundredths of a degree can dramatically transform the system's electronic properties. Setting a precise and uniform twist angle for a stack remains difficult; hence, determining that twist angle and mapping its spatial variation is very important. Techniques have emerged to do this by imaging the moiré, but most of these require sophisticated infrastructure, time-consuming sample preparation beyond stack synthesis, or both. In this work, we show that torsional force microscopy (TFM), a scanning probe technique sensitive to dynamic friction, can reveal surface and shallow subsurface structure of van der Waals stacks on multiple length scales: the moirés formed between bi-layers of graphene and between graphene and hexagonal boron nitride (hBN) and also the atomic crystal lattices of graphene and hBN. In TFM, torsional motion of an Atomic Force Microscope (AFM) cantilever is monitored as it is actively driven at a torsional resonance while a feedback loop maintains contact at a set force with the sample surface. TFM works at room temperature in air, with no need for an electrical bias between the tip and the sample, making it applicable to a wide array of samples. It should enable determination of precise structural information including twist angles and strain in moiré superlattices and crystallographic orientation of van der Waals flakes to support predictable moiré heterostructure fabrication.

Ray-based framework for state identification in quantum dot devices.

Quantum dots (QDs) defined with electrostatic gates are a leading platform for a scalable quantum computing implementation. However, with increasing numbers of qubits, the complexity of the control parameter space also grows. Traditional measurement techniques, relying on complete or near-complete exploration via two-parameter scans (images) of the device response, quickly become impractical with increasing numbers of gates. Here we propose to circumvent this challenge by introducing a measurement technique relying on one-dimensional projections of the device response in the multidimensional parameter space. Dubbed the "ray-based classification (RBC) framework," we use this machine learning approach to implement a classifier for QD states, enabling automated recognition of qubit-relevant parameter regimes. We show that RBC surpasses the 82% accuracy benchmark from the experimental implementation of image-based classification techniques from prior work, while reducing the number of measurement points needed by up to 70%. The reduction in measurement cost is a significant gain for time-intensive QD measurements and is a step forward toward the scalability of these devices. We also discuss how the RBC-based optimizer, which tunes the device to a multiqubit regime, performs when tuning in the two-dimensional and three-dimensional parameter spaces defined by plunger and barrier gates that control the QDs. This work provides experimental validation of both efficient state identification and optimization with machine learning techniques for non-traditional measurements in quantum systems with high-dimensional parameter spaces and time-intensive measurements.

Autotuning of double dot devices in situ with machine learning.

The current practice of manually tuning quantum dots (QDs) for qubit operation is a relatively time-consuming procedure that is inherently impractical for scaling up and applications. In this work, we report on the in situ implementation of a recently proposed autotuning protocol that combines machine learning (ML) with an optimization routine to navigate the parameter space. In particular, we show that a ML algorithm trained using exclusively simulated data to quantitatively classify the state of a double-QD device can be used to replace human heuristics in the tuning of gate voltages in real devices. We demonstrate active feedback of a functional double-dot device operated at millikelvin temperatures and discuss success rates as a function of the initial conditions and the device performance. Modifications to the training network, fitness function, and optimizer are discussed as a path toward further improvement in the success rate when starting both near and far detuned from the target double-dot range.

QFlow lite dataset: A machine-learning approach to the charge states in quantum dot experiments.

BACKGROUND: Over the past decade, machine learning techniques have revolutionized how research and science are done, from designing new materials and predicting their properties to data mining and analysis to assisting drug discovery to advancing cybersecurity. Recently, we added to this list by showing how a machine learning algorithm (a so-called learner) combined with an optimization routine can assist experimental efforts in the realm of tuning semiconductor quantum dot (QD) devices. Among other applications, semiconductor quantum dots are a candidate system for building quantum computers. In order to employ QDs, one needs to tune the devices into a desirable configuration suitable for quantum computing. While current experiments adjust the control parameters heuristically, such an approach does not scale with the increasing size of the quantum dot arrays required for even near-term quantum computing demonstrations. Establishing a reliable protocol for tuning QD devices that does not rely on the gross-scale heuristics developed by experimentalists is thus of great importance. MATERIALS AND METHODS: To implement the machine learning-based approach, we constructed a dataset of simulated QD device characteristics, such as the conductance and the charge sensor response versus the applied electrostatic gate voltages. The gate voltages are the experimental 'knobs' for tuning the device into useful regimes. Here, we describe the methodology for generating the dataset, as well as its validation in training convolutional neural networks. RESULTS AND DISCUSSION: From 200 training sets sampled randomly from the full dataset, we show that the learner's accuracy in recognizing the state of a device is ≈ 96.5% when using either current-based or charge-sensor-based training. The spread in accuracy over our 200 training sets is 0.5% and 1.8% for current- and charge-sensor-based data, respectively. In addition, we also introduce a tool that enables other researchers to use this approach for further research: QFlow lite-a Python-based mini-software suite that uses the dataset to train neural networks to recognize the state of a device and differentiate between states in experimental data. This work gives the definitive reference for the new dataset that will help enable researchers to use it in their experiments or to develop new machine learning approaches and concepts.