ABSTRACT
LR-115 Solid State Nuclear Track Detector (SSNTD) is commonly utilized for quantifying indoor radon-thoron levels, by tallying the tracks formed in the films by exposure to these gases. Conventionally, sodium hydroxide (NaOH) is used to etch LR-115 films for 90 min at 60°C. However, this study suggests a time-efficient alternative approach utilizing potassium hydroxide (KOH) as the etchant. In an initial investigation, the bulk etch rates of KOH were examined at different normalities and temperatures, revealing that KOH exhibited nearly double the bulk etch rates compared to NaOH. Subsequently, a specially designed controlled experiment was conducted to assess the efficacy of the technique by enumerating the tracks generated in the films. Both etchants demonstrated very similar track counts for identical controlled exposures, indicating the reliability of the method. A consistent behavior was observed in the real-case scenario of LR-115 films exposed indoors to alpha particles from radon and its decay products. In both experiments, the etching with KOH for 45 min gave track densities comparable to standard NaOH etching for 90 min, highlighting the time efficiency of this method. Investigations were carried out into track shape and size features, aspects crucial to the measurement technique, using microscopic imaging of samples treated with both etchants. Strikingly similar track shapes and sizes were observed, affirming the consistency in the track measurement technique. Collectively, these findings suggest that KOH etchant reduces the etching time, presenting itself as a time-efficient method for quantifying radon and thoron track density.
