ABSTRACT
A versatile apparatus to measure the cross-plane Seebeck coefficient and the resistivity of bulk samples shaped as disks or thin plates, over a temperature range of 300 K-620 K with possible extension to higher temperatures, is presented. It is constructed from readily available equipment and instrumentation with parts that are easily manufactured. The Seebeck coefficient is measured over an average region of the sample under steady-state conditions. The sample resistance is measured using a four-point alternating current method and scaled to room temperature measurements with known geometry to calculate resistivity. A variety of sample shapes are supported. Most importantly, the support of the thin disk geometry allows for the very same samples to be used in a laser flash instrument. The design allows for rough vacuum, high vacuum, or purging with inert gases in the sample chamber. Measurements on thermoelectric ZnSb and a Ni reference material are presented.
ABSTRACT
We use the sum of the ionization and Auger energy, the so-called Auger parameter, measured from the x-ray photoelectron spectrum, to study the valence electron distribution in the skutterudite CoP(3). The electron transfer between Co and P was estimated using models relating changes in Auger parameter values to charge transfer. It was found that each P atom gains 0.24 e(-), and considering the unit formula CoP(3) this is equivalent to a donation of 0.72 e(-) per Co atom. This is in agreement with a recent electron energy-loss spectroscopy study, which indicates a charge transfer of 0.77 e(-)/atom from Co to P.
