Response of Bilayer and Trilayer Graphene to High-Energy Heavy Ion Irradiation.

High-energy heavy ion irradiation is a very useful tool for the nanostructuring of 2D materials because defects can be introduced in a controlled way. This approach is especially attractive for the mass production of graphene nanomembranes when nanopore size and density can easily be tuned by ion irradiation parameters such as ion energy and applied fluence. Therefore, understanding the basic mechanisms in nanopore formation due to high-energy heavy ion impact is of the highest importance. In the present work, we used Raman spectroscopy to investigate the response of bilayer and trilayer graphene to this type of irradiation. Spectra obtained from graphene samples irradiated with 1.8 MeV I, 23 MeV I, 3 MeV Cu, 18 MeV Cu, and 12 MeV Si beams were analysed using the Lucchese model. It was found that the efficiency of damage production scales strongly with nuclear energy loss. Therefore, even for the most energetic 23 MeV I beam, the electronic energy loss does not contribute much to damage formation and ion tracks are unlikely to be formed.

High-Energy Heavy Ion Irradiation of Al2O3, MgO and CaF2.

High-energy heavy ion irradiation can produce permanent damage in the target material if the density of deposited energy surpasses a material-dependent threshold value. It is known that this threshold can be lowered in the vicinity of the surface or in the presence of defects. In the present study, we established threshold values for Al2O3, MgO and CaF2 under the above-mentioned conditions, and found those values to be much lower than expected. By means of atomic force microscopy and Rutherford backscattering spectrometry in channelling mode, we present evidence that ion beams with values of 3 MeV O and 5 MeV Si, despite the low density of deposited energy along the ion trajectory, can modify the structure of investigated materials. The obtained results should be relevant for radiation hardness studies because, during high-energy ion irradiation, unexpected damage build-up can occur under similar conditions.

Energy Retention in Thin Graphite Targets after Energetic Ion Impact.

High energy ion irradiation is an important tool for nanoscale modification of materials. In the case of thin targets and 2D materials, which these energetic ions can pierce through, nanoscale modifications such as production of nanopores can open up pathways for new applications. However, materials modifications can be hindered because of subsequent energy release via electron emission. In this work, we follow energy dissipation after the impact of an energetic ion in thin graphite target using Geant4 code. Presented results show that significant amount of energy can be released from the target. Especially for thin targets and highest ion energies, almost 40% of deposited energy has been released. Therefore, retention of deposited energy can be significantly altered and this can profoundly affect ion track formation in thin targets. This finding could also have broader implications for radiation hardness of other nanomaterials such as nanowires and nanoparticles.

Investigation of Ion Irradiation Effects in Silicon and Graphite Produced by 23 MeV I Beam.

Both silicon and graphite are radiation hard materials with respect to swift heavy ions like fission fragments and cosmic rays. Recrystallisation is considered to be the main mechanism of prompt damage anneal in these two materials, resulting in negligible amounts of damage produced, even when exposed to high ion fluences. In this work we present evidence that these two materials could be susceptible to swift heavy ion irradiation effects even at low energies. In the case of silicon, ion channeling and electron microscopy measurements reveal significant recovery of pre-existing defects when exposed to a swift heavy ion beam. In the case of graphite, by using ion channeling, Raman spectroscopy and atomic force microscopy, we found that the surface of the material is more prone to irradiation damage than the bulk.

Shape Deformation in Ion Beam Irradiated Colloidal Monolayers: An AFM Investigation.

Self-assembly of colloidal monolayers represents a prominent approach to the fabrication of nanostructures. The modification of the shape of colloidal particles is essential in order to enrich the variety of attainable patterns which would be limited by the typical assembly of spherical particles in a hexagonal arrangement. Polymer particles are particularly promising in this sense. In this article, we investigate the deformation of closely-packed polystyrene particles under MeV oxygen ion irradiation at normal incidence using atomic force microscopy (AFM). By developing a procedure based on the fitting of particle topography with quadrics, we reveal a scenario of deformation more complex than the one observed in previous studies for silica particles, where several phenomena, including ion hammering, sputtering, chemical modifications, can intervene in determining the final shape due to the specific irradiation conditions. In particular, deformation into an ellipsoidal shape is accompanied by shrinkage and polymer redistribution with the presence of necks between particles for increasing ion fluence. In addition to casting light on particle irradiation in a regime not yet explored, we present an effective method for the characterization of the colloidal particle morphology which can be applied to describe and understand particle deformation in other regimes of irradiation or with different techniques.

Monitoring Ion Track Formation Using In Situ RBS/c, ToF-ERDA, and HR-PIXE.

The aim of this work is to investigate the feasibility of ion beam analysis techniques for monitoring swift heavy ion track formation. First, the use of the in situ Rutherford backscattering spectrometry in channeling mode to observe damage build-up in quartz SiO₂ after MeV heavy ion irradiation is demonstrated. Second, new results of the in situ grazing incidence time-of-flight elastic recoil detection analysis used for monitoring the surface elemental composition during ion tracks formation in various materials are presented. Ion tracks were found on SrTiO₃, quartz SiO₂, a-SiO₂, and muscovite mica surfaces by atomic force microscopy, but in contrast to our previous studies on GaN and TiO₂, surface stoichiometry remained unchanged. Third, the usability of high resolution particle induced X-ray spectroscopy for observation of electronic dynamics during early stages of ion track formation is shown.

Formation of swift heavy ion tracks on a rutile TiO2 (001) surface.

Nanostructuring of surfaces and two-dimensional materials using swift heavy ions offers some unique possibilities owing to the deposition of a large amount of energy localized within a nanoscale volume surrounding the ion trajectory. To fully exploit this feature, the morphology of nanostructures formed after ion impact has to be known in detail. In the present work the response of a rutile TiO2 (001) surface to grazing-incidence swift heavy ion irradiation is investigated. Surface ion tracks with the well known intermittent inner structure were successfully produced using 23 MeV I ions. Samples irradiated with different ion fluences were investigated using atomic force microscopy and grazing-incidence small-angle X-ray scattering. With these two complementary approaches, a detailed description of the swift heavy ion impact sites, i.e. the ion tracks on the surface, can be obtained even for the case of multiple ion track overlap. In addition to the structural investigation of surface ion tracks, the change in stoichiometry of the rutile TiO2 (001) surface during swift heavy ion irradiation was monitored using in situ time-of-flight elastic recoil detection analysis, and a preferential loss of oxygen was found.