ABSTRACT
Background: A key factor for the success or failure of an implant is how the stresses are transferred to the surrounding bone. The implantâabutment connection (IAC) is paramount for implant success. The purpose of this finite element analysis (FEA) study was to evaluate the stress distribution in and around three different implantâabutment interfaces with platform-switched and platform-matched abutments using the finite element method (FEM). Methods: Three distinct types of IAC were selected: tri-channel internal connection, conical connection, and internal hex connection. Six models were generated, three in platform-switched and three in non-platform-switched configuration. Computer-Aided Three-Dimensional Interactive Application (CATIA) V5 R20 software was used to generate virtual models of the implants and the mandible. The models were transferred to Analysis of Systems (ANSYS) 15.0 software, in which the models were meshed and underwent FEA. Results: On the crestal bone, the highest von Mises stresses in platform-switched abutments were noticed in the internal hex implantâabutment system (370 MPa), followed by the tri-channel implantâabutment system (190 MPa) and conical implantâabutment system (110 MPa). On the implant and the abutment screw, the highest von Mises stresses were observed in the internal hex implantâabutment system, followed by the conical implant abutment system and tri-channel implantâabutment system. Platform-switched implants had a more favorable stress distribution on crestal bone. Conclusion: Within the constraints of the current study, the internal hex connection exhibited the highest stress. In contrast, the conical abutment connection with platform switching configuration had more favorable stress distribution in crestal bone than other implant abutment systems.