ABSTRACT
For magnetic domain imaging, with a very high spatial resolution magnetic force microscope, the tip-sample distance should be as small as possible. However, magnetic imaging near the sample surface is very difficult with conventional magnetic force microscopy (MFM) because the interactive forces between the tip and sample include van der Waals and electrostatic forces along with a magnetic force. In this study, we proposed alternating MFM which only extracts a magnetic force near the sample surface without any topographic and electrical crosstalk. In the present method, the magnetization of an FeCo-GdO x superparamagnetic tip is modulated by an external AC magnetic field in order to measure the magnetic domain structure without any perturbation from the other forces near the sample surface. Moreover, it is demonstrated that the proposed method can also measure the strength and identify the polarities of the second derivative of the perpendicular stray field from a thin film permanent magnet with a DC demagnetized state and remanent state.
ABSTRACT
We investigated a method to obtain a stable contrast mode on the TiO2(110) surface. The stable contrast rate is approximately 95% with a W-coated Si cantilever, which demonstrates that a stable tip apex plays an important role to obtain the real geometry of the surface during atomic force microscopy measurement. Information related to surface structure and tunnelling current on the TiO2(110) surface can be obtained by the W-coated Si cantilever. It is possible to investigate the electronic structure and surface potential on the TiO2(110) surface with atomic resolution. In particular, the proposed method could be widely applied to investigate the catalytic activity and the mechanism of a catalytic reaction by a metal-coated tip in the future.
ABSTRACT
The present work proposes magnetic resonance force microscopy (MRFM) based on ferromagnetic resonance (FMR) modulation of a magnetic tip using microwave transmission via a coaxial resonator instead of using conventional microwave irradiation by an external antenna. In this MRFM, the coaxial resonator is electrically connected to the magnetic cantilever tip, which enables simple implementation of FMR excitation of a magnetic tip in conventional magnetic force microscopy. The FMR frequency of the tip can be easily extracted from the reflection spectrum of a transmission line connected to the magnetic tip. The excitation of tip FMR is confirmed from the microwave frequency dependence of the mechanical response of the tip oscillation. This MRFM is effective for extracting the magnetic interaction force near a sample surface without perturbation of its magnetic state. Nanometer-scale imaging of magnetic domain structures on a demagnetized thin-film permanent magnet is successfully demonstrated.
ABSTRACT
We present an experimental study of coexisting p(2 × 1) and c(6 × 2) phases on an oxygen-terminated Cu(110) surface by noncontact atomic force microscopy (NC-AFM) at 78 K. Ball models of the growth processes of coexisting p(2 × 1)/c(6 × 2) phases on a terrace and near a step are proposed. We found that the p(2 × 1) and c(6 × 2) phases are grown from the super Cu atoms on both sides of O-Cu-O rows of an atomic spacing. In this paper, we summarize our investigations of an oxygen-terminated Cu(110) surface by NC-AFM employing O- and Cu-terminated tips. Also, we state several problems and issues for future investigation.
ABSTRACT
Tungsten (W) is significantly suitable as a tip material for atomic force microscopy (AFM) because its high mechanical stiffness enables the stable detection of tip-sample interaction forces. We have developed W sputter-coating equipment to compensate the drawbacks of conventional Si cantilever tips used in AFM measurements. By employing an ion gun commonly used for sputter cleaning of a cantilever tip, the equipment is capable of depositing conductive W films in the preparation chamber of a general ultrahigh vacuum (UHV)-AFM system without the need for an additional chamber or transfer system. This enables W coating of a cantilever tip immediately after sputter cleaning of the tip apex and just before the use in AFM observations. The W film consists of grain structures, which prevent tip dulling and provide sharpness (<3 nm in radius of curvature at the apex) comparable to that of the original Si tip apex. We demonstrate that in non-contact (NC)-AFM measurement, a W-coated Si tip can clearly resolve the atomic structures of a Ge(001) surface without any artifacts, indicating that, as a force sensor, the fabricated W-coated Si tip is superior to a bare Si tip.
ABSTRACT
A sharp probe tip with atomic scale stability is essential and desirable for noncontact atomic force microscopy (NC-AFM) studies at the atomic scale. We observed a Ge(001) surface using both a Si cantilever and a tungsten coated Si cantilever at room temperature in order to investigate the influence of the tip apex structure on the NC-AFM images. By using the Si cantilever, we first obtained four types of image at the atomic scale which can be explained assuming a dimer structure on the tip apex. On the other hand, the home-made tungsten coated tip, which has atomic scale stability and high electric conductivity, imaged the so-called ordered c(4 x 2) structure without any artifacts. The tungsten coated cantilever was found to have significantly higher performance for NC-AFM studies at the atomic scale than the Si cantilever.
