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1.
Opt Express ; 29(19): 30296-30306, 2021 Sep 13.
Article in English | MEDLINE | ID: mdl-34614755

ABSTRACT

We present an experimental and theoretical analysis of chromatic aberration in a monolithic metasurface focusing mirror. The planar focusing mirror is based on a monolithic high contrast grating made from GaAs, designed for a wavelength of 980 nm. Light is focused on the high refractive index side of the mirror. Our measurements, performed between 890 and 1050 nm, indicate a shift of the focal point position that is inversely proportional to the wavelength. The experimental results are in very good agreement with our simulations, in terms of both the position of the focal point and the spectral dependence. Based on our numerical simulations, we show that simply modifying the grating height does not lead to significant alteration of the focal length or to any noticeable reduction in chromatic aberration. Using numerical simulations, we analyze how the height of the stripes, the refractive index of the grating material, and its dispersion combine to influence the chromatic aberration of the mirror.

2.
ACS Appl Mater Interfaces ; 13(21): 25533-25539, 2021 Jun 02.
Article in English | MEDLINE | ID: mdl-34008943

ABSTRACT

We present the first experimental demonstration of a planar focusing monolithic subwavelength grating mirror. The grating is formed on the surface of GaAs and focuses 980 nm light in one dimension on the high-refractive-index side of the mirror. According to our measurements, the focal length is 475 µm (300 µm of which is GaAs) and the numerical aperture is 0.52. The intensity of the light at the focal point is 23 times larger than that of the incident light. To the best of our knowledge, this is the highest value reported for a grating mirror. Moreover, the full width at half-maximum (FWHM) at the focal point is only 3.9 µm, which is the smallest reported value for a grating mirror. All of the measured parameters are close to or very close to the theoretically predicted values. Our realization of a sophisticated design of a focusing monolithic subwavelength grating opens a new avenue to technologically simple fabrication of the gratings for use in diverse optoelectronic materials and applications.

3.
Opt Express ; 28(26): 38745-38761, 2020 Dec 21.
Article in English | MEDLINE | ID: mdl-33379437

ABSTRACT

Here, we describe in detail a procedure for the numerical design of planar focusing mirrors based on monolithic high contrast gratings. We put a special emphasis on the reconstruction of the hyperbolic phase of these mirrors and we conclude that the phase does not have to be perfectly mimicked to obtain a focusing reflector. We consider here the grating mirrors that focus light not in the air but in the GaAs substrate and we compare them with conventional parabolic reflectors of corresponding dimensions. The light intensity at the focal point of the focusing grating mirrors was found to be comparable to that of the parabolic reflector. Moreover, the reflectivity of the focusing grating mirrors is almost as high as that of parabolic mirrors covered with an additional reflecting structure, if the ratio of the reflector width to the focal length is less than 0.6. Planar focusing grating mirrors offer a good alternative to parabolic mirrors, especially considering the complexity of fabricating three-dimensional structures compared to planar structures.

4.
J Appl Crystallogr ; 50(Pt 1): 288-292, 2017 Feb 01.
Article in English | MEDLINE | ID: mdl-28190993

ABSTRACT

Epitaxial multilayers and superlattice (SL) structures are gaining increasing importance as they offer the opportunity to create artificial crystals with new functionalities. These crystals deviate from the parent bulk compounds not only in terms of the lattice constants but also in the symmetry classification, which renders calculation of their X-ray diffraction (XRD) patterns tedious. Nevertheless, XRD is essential to get information on the multilayer/SL structure such as, for example, out-of-plane lattice constants, strain relaxation and period length of the crystalline SL. This article presents a powerful yet simple program, based on the general one-dimensional kinematic X-ray diffraction theory, which calculates the XRD patterns of tailor-made multilayers and thus enables quantitative comparison of measured and calculated XRD data. As the multilayers are constructed layer by layer, the final material stack can be entirely arbitrary. Moreover, CADEM is very flexible and can be straightforwardly adapted to any material system. The source code of CADEM is available as supporting material for this article.

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