Investigation of Tibetian Plateau varnish: new findings at the nanoscale using focused ion beam and transmission electron microscopy techniques.

Dual-beam focused ion beam microscopy (FIB/SEM) preparation of rock varnish for high-resolution transmission electron microscopy (HR-TEM) has enabled us to characterize unreported nanostructures. Fossils, unreported textures, and compositional variability were observed at the nanoscale. These techniques could provide a method for studying ancient terrestrial and extra-terrestrial environments to better understand geological processes at the nanoscale.