Performance of microchannel plate based detectors for <25 keV x rays: Monte Carlo simulations and comparisons with experimental results.

We present the results of Monte Carlo simulations of the microchannel plate (MCP) response to x rays in the 250 eV to 25 keV energy range as a function of both x-ray energy and impact angle and their comparisons with the experimental results from the X8A beamline at the National Synchrotron Light Source at Brookhaven National Laboratory. Incoming x rays interact with the lead glass of the microchannel plate, producing photoelectrons. Transport of the photoelectrons is neglected in this model, and it is assumed that photoelectrons deposit all their energy at the point they are created. This deposition leads to the generation of many secondary electrons, some fraction of which diffuse to the MCP pore surface where they can initiate secondary electron cascades in the pore under an external voltage bias. X-ray penetration through multiple MCP pore walls is increasingly important above 5 keV, and the effect of this penetration on MCP performance is studied. In agreement with past measurements, we find that the dependence of MCP sensitivity with angle relative to the pore bias changes from a cotangent dependence to angular independence and then proceeds to a secant dependence as the x-ray energy increases. We also find that with the increasing x-ray energy, the MCP gain sensitivity as a function of bias voltage decreases. The simulations also demonstrate that for x rays incident normal to the MCP surface, spatial resolution shows little dependence on the x-ray energy but degrades with the increasing x-ray energy as the angle of incidence relative to the surface normal increases. This agrees with experimental measurements. Simulation studies have also been completed for MCPs gated with a subnanosecond voltage pulse. We find that the optical gate profile width increases as the x-ray energy is increased above 5 keV, a consequence of increased x-ray penetration at energies >5 keV. Simulations of the pulsed dynamic range show that the dynamic range varies between ∼100 and 1000 depending on x-ray energy and peak voltage.

Diffraction properties of cylindrically bent KAP crystals in energy range of 2.3-7.5 keV using synchrotron radiation.

Verification of physics models and computer simulations are heavily reliant upon the accuracy of experimental measurements. Calibration of instrument responses becomes an important step to achieve this goal. This paper presents systematic studies of bent potassium acid phthalate (KAP) crystals using Lawrence Berkeley National Laboratories, Advanced Light Source, beamline 9.3.1 in the energy range of 2.3 to 7.5 keV. A set of KAP crystals, gradually bent from flat up to a 50.8 mm cylindrical curvature. The measured integrated reflectivity for this set of KAP crystals shows good agreement with the X-ray Oriented Program (XOP) calculations when adjusting the Debye-Waller temperature factor and using the multilamellar model in the calculations. Significant differences in rocking curve profiles were observed between experimental measurements and theory. A forward convolution model and software code were developed to include experimental parameters, allowing the investigation of the difference between measurements and calculations. After considering the experimental parameters, good agreements were obtained for the rocking curve profiles for all bending radii with a unique set of parameters. Our results show that XOP can be a useful and reliable tool to predict performance of cylindrically bent KAP crystals in this energy range.

Monte Carlo simulations of microchannel plate detectors. II. Pulsed voltage results.

This paper is the second part of a continuing study of straight-channel microchannel plate (MCP)-based x-ray detectors. Such detectors are a useful diagnostic tool for two-dimensional, time-resolved imaging and time-resolved x-ray spectroscopy. To interpret the data from such detectors, it is critical to develop a better understanding of the behavior of MCPs biased with subnanosecond voltage pulses. The subject of this paper is a Monte Carlo computer code that simulates the electron cascade in a MCP channel under an arbitrary pulsed voltage, particularly those pulses with widths comparable to the transit time of the electron cascade in the MCP under DC voltage bias. We use this code to study the gain as a function of time (also called the gate profile or optical gate) for various voltage pulse shapes, including pulses measured along the MCP. In addition, experimental data of MCP behavior in pulsed mode are obtained with a short-pulse UV laser. Comparisons between the simulations and experimental data show excellent agreement for both the gate profile and the peak relative sensitivity along the MCP strips. We report that the dependence of relative gain on peak voltage is larger in pulsed mode when the width of the high-voltage waveform is smaller than the transit time of cascading electrons in the MCP.

Monte Carlo simulations of high-speed, time-gated microchannel-plate-based x-ray detectors: saturation effects in dc and pulsed modes and detector dynamic range.

We present here results of continued efforts to understand the performance of microchannel plate (MCP)-based, high-speed, gated, x-ray detectors. This work involves the continued improvement of a Monte Carlo simulation code to describe MCP performance coupled with experimental efforts to better characterize such detectors. Our goal is a quantitative description of MCP saturation behavior in both static and pulsed modes. A new model of charge buildup on the walls of the MCP channels is briefly described. The simulation results are compared to experimental data obtained with a short-pulse, high-intensity ultraviolet laser, and good agreement is found. These results indicate that a weak saturation can change the exponent of gain with voltage and that a strong saturation leads to a gain plateau. These results also demonstrate that the dynamic range of a MCP in pulsed mode has a value of between 10(2) and 10(3).

Monte Carlo simulations of microchannel plate detectors. I. Steady-state voltage bias results.

X-ray detectors based on straight-channel microchannel plates (MCPs) are a powerful diagnostic tool for two-dimensional, time-resolved imaging and time-resolved x-ray spectroscopy in the fields of laser-driven inertial confinement fusion and fast Z-pinch experiments. Understanding the behavior of microchannel plates as used in such detectors is critical to understanding the data obtained. The subject of this paper is a Monte Carlo computer code we have developed to simulate the electron cascade in a MCP under a static applied voltage. Also included in the simulation is elastic reflection of low-energy electrons from the channel wall, which is important at lower voltages. When model results were compared to measured MCP sensitivities, good agreement was found. Spatial resolution simulations of MCP-based detectors were also presented and found to agree with experimental measurements.