Implementation of the INTERGROWTH-21st Project in the UK.

There are approximately 10,000 births per year in the county of Oxfordshire in the UK, which is one of the two European sites for the International Fetal and Newborn Growth Consortium for the 21(st) Century (INTERGROWTH-21(st) ) Project. The samples for both components of the project--the Fetal Growth Longitudinal Study (FGLS) and Newborn Cross-Sectional Study (NCSS)--were drawn from the John Radcliffe Hospital, a major university hospital with a large regional role that covers more than 75% of deliveries in the county. Special activities to encourage participation in this population included the formation of a research coalition to streamline recruitment in the Maternity Unit and the distribution of study information leaflets to women using the hospital's antenatal care service. This was a demanding project and several challenges were overcome to reach recruitment targets and to maintain high standards of data quality. Amongst the major challenges for FGLS at this study site was the level of ineligibility because of maternal age, smoking and body mass index (BMI) ≥ 30. The major challenge for the NCSS field teams was to ensure that all anthropometric data were collected before the early discharge of uncomplicated deliveries, often within 6 hours of birth. It is evident from our experience in implementing this project that, when large-scale clinical studies are meticulously planned and avoid major disruption to routine clinical care, they are well received by hospital staff and can contribute to the improvement of the overall standard of clinical care.

Treating retardation effects in valence EELS spectra for Kramers-Kronig analysis.

Retardation effects such as Cerenkov losses and waveguide modes alter the valence electron energy-loss spectrum of semiconductors and insulators as soon as the speed of the probing electron exceeds the speed of light inside the probed medium. This leads to the dilemma, that optical properties from these media cannot be determined correctly using electron energy-loss spectrometry (EELS) if no corrections are applied. In this work we present two ways out of this dilemma: a reduction of the beam energy and the application of an off-line correction. We demonstrate the accuracy of these two methods by using two similar layers of Si(x):H having slightly different refractive indices and discuss the impact of the normalization parameter during Kramers-Kronig analysis (KKA) on the obtained dielectric properties. We further demonstrate that KKA can be applied without the use of standard specimens, if thickness determination using transmission electron microscopy and EELS is accurate enough.