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1.
Nanotechnology ; 20(26): 264018, 2009 Jul 01.
Article in English | MEDLINE | ID: mdl-19509445

ABSTRACT

Non-contact atomic force microscopy is rapidly expanding from ultra-high vacuum to include the study of surfaces and biomolecules in liquids by high resolution imaging and force spectroscopy. This is despite the additional frequency shift noise due to the inherently low Q factor of the cantilever oscillating in a liquid. In this paper we present a tip based on an optical fiber which can operate in liquid with Q factors in excess of 100 using a 'diving bell' arrangement which allows only a small portion of the tip to be submerged. We demonstrate stable imaging and force spectroscopy using this set-up. The tips are based on scanning near-field optical microscopy tips and, when used with NC-AFM, provide a method of combining both high resolution mechanical and fluorescence studies of biomolecules and cells.


Subject(s)
Microscopy, Atomic Force/instrumentation , Optical Fibers , Equipment Design , Glass/chemistry , Lipids/chemistry , Microscopy, Atomic Force/methods , Reproducibility of Results , Water/chemistry
2.
Nanotechnology ; 20(26): 264012, 2009 Jul 01.
Article in English | MEDLINE | ID: mdl-19509452

ABSTRACT

There has been increasing focus on the use of Kelvin probe force microscopy (KPFM) for the determination of local electronic structure in recent years, especially in systems where other methods, such as scanning tunnelling microscopy/spectroscopy, may be intractable. We have examined three methods for determining the local apparent contact potential difference (CPD): frequency modulation KPFM (FM-KPFM), amplitude modulation KPFM (AM-KPFM), and frequency shift-bias spectroscopy, on a test system of 3,4,9,10-perylene tetracarboxylic dianhydride (PTCDA) on NaCl, an example of an organic semiconductor on a bulk insulating substrate. We will discuss the influence of the bias modulation on the apparent CPD measurement by FM-KPFM compared to the DC-bias spectroscopy method, and provide a comparison of AM-KPFM, AM-slope detection KPFM and FM-KPFM imaging resolution and accuracy. We will also discuss the distance dependence of the CPD as measured by FM-KPFM for both the PTCDA organic deposit and the NaCl substrate.


Subject(s)
Anhydrides/chemistry , Microscopy, Atomic Force/methods , Perylene/analogs & derivatives , Sodium Chloride/chemistry , Algorithms , Electricity , Equipment Design , Microscopy, Atomic Force/instrumentation , Perylene/chemistry , Spectrum Analysis/instrumentation , Spectrum Analysis/methods
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