1.
Opt Express
; 20(4): 4419-27, 2012 Feb 13.
Article
in English
| MEDLINE
| ID: mdl-22418201
ABSTRACT
Heteroepitaxial strain in ferroelectric thin films is known to have a significant impact on both their low and high frequency dielectric properties. In this paper, we use ex-situ spectroscopic ellipsometry to study the strain evolution with film thickness, and strain relaxation in ferroelectric Ba0.5Sr0.5