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1.
Opt Express ; 20(20): 22224-32, 2012 Sep 24.
Article in English | MEDLINE | ID: mdl-23037370

ABSTRACT

We demonstrate a high speed GeSi electro-absorption (EA) modulator monolithically integrated on 3 µm silicon-on-insulator (SOI) waveguide. The demonstrated device has a compact active region of 1.0 × 55 µm(2), an insertion loss of 5 dB and an extinction ratio of 6 dB at wavelength of 1550 nm. The modulator has a broad operating wavelength range of 35 nm and a 3 dB bandwidth of 40.7 GHz at 2.8 V reverse bias. This compact and energy efficient modulator is a key building block for optical interconnection applications.


Subject(s)
Germanium/chemistry , Optical Devices , Silicon/chemistry , Telecommunications/instrumentation , Absorption , Computer-Aided Design , Equipment Design , Equipment Failure Analysis , Light , Scattering, Radiation
2.
Opt Express ; 19(9): 8715-20, 2011 Apr 25.
Article in English | MEDLINE | ID: mdl-21643123

ABSTRACT

We present the design and fabrication of a waveguide-based Ge electro-absorption (EA) modulator integrated with a 3 µm silicon-on-isolator (SOI) waveguide. The proposed Ge EA modulator employs a butt-coupled horizontally-oriented p-i-n structure. The optical design achieves a low-loss transition from Ge to Si waveguides. The interaction between the optical mode of the waveguide and the bias induced electric field in the p-i-n structure was maximized to achieve high modulation efficiency. By balancing the trade-offs between the extinction ratio and the insertion loss of the device, an optimal working regime was identified. The measurement results from a fabricated device were used to verify the design. Under a -4Vpp reverse bias, the device demonstrates a total insertion loss (including the transition loss) of 2.7-5.2 dB and an extinction ratio of 4.9-8.2 dB over the wavelength range of 1610-1640 nm. Subtracting the contribution of the transition loss, the Δα/α value for the fabricated device was estimated to be between 2.2 and 3.2 with an electric field around 55 kV/cm.


Subject(s)
Germanium/chemistry , Optical Devices , Refractometry/instrumentation , Silicon/chemistry , Telecommunications/instrumentation , Computer-Aided Design , Electric Conductivity , Equipment Design , Equipment Failure Analysis , Semiconductors , Systems Integration
3.
Opt Express ; 19(11): 10967-72, 2011 May 23.
Article in English | MEDLINE | ID: mdl-21643357

ABSTRACT

We present two effective approaches to improve the responsivity of high speed waveguide-based Ge photodetectors integrated on a 0.25 µm silicon-on-insulator (SOI) platform. The main cause of poor responsivity is identified as metal absorption from the top contact to Ge. By optimizing Ge thickness and offsetting the contact window, we have demonstrated that the responsivity can be improved from 0.6A/W to 0.95 A/W at 1550 nm with 36 GHz 3 dB bandwidth. We also demonstrate that a wider device with double offset contacts can achieve 1.05 A/W responsivity at 1550 nm and 20 GHz 3 dB bandwidth.

4.
Opt Express ; 19(8): 7062-7, 2011 Apr 11.
Article in English | MEDLINE | ID: mdl-21503018

ABSTRACT

We demonstrate a compact waveguide-based high-speed Ge electro-absorption (EA) modulator integrated with a single mode 3 µm silicon-on-isolator (SOI) waveguide. The Ge EA modulator is based on a horizontally-oriented p-i-n structure butt-coupled with a deep-etched silicon waveguide, which transitions adiabatically to a shallow-etched single mode large core SOI waveguide. The demonstrated device has a compact active region of 1.0 × 45 µm(2), a total insertion loss of 2.5-5 dB and an extinction ratio of 4-7.5 dB over a wavelength range of 1610-1640 nm with -4V(pp) bias. The estimated Δα/α value is in the range of 2-3.3. The 3 dB bandwidth measurements show that the device is capable of operating at more than 30 GHz. Clear eye-diagram openings at 12.5 Gbps demonstrates large signal modulation at high transmission rate.


Subject(s)
Electronics/instrumentation , Germanium/chemistry , Optics and Photonics , Physics/methods , Silicon/chemistry , Absorption , Equipment Design , Materials Testing , Optical Devices , Refractometry/instrumentation
5.
Opt Express ; 18(24): 25225-31, 2010 Nov 22.
Article in English | MEDLINE | ID: mdl-21164869

ABSTRACT

We present a broadband 2x2 electro-optic silicon switch with an ultralow switching power and fast switching time based on a Mach-Zehnder interferometer (MZI). Forward-biased p-i-n junctions are employed to tune the phase of silicon waveguides in the MZI, to achieve a π-phase switching power of 0.6 mW with a drive voltage 0.83 V with a MZI arm length of 4 mm. The 10%-90% switching time is demonstrated to be 6 ns. Optical crosstalk levels lower than -17 dB are obtained for an optical bandwidth of 60 nm. The free carrier induced silicon refractive index change is extracted from the experimental results for the concentration range from 10(16) to 10(17) cm(-3). We find that at the concentration of 10(16) cm(-3), the index change is about twice that calculated by the commonly used index change equation.

6.
Opt Lett ; 35(19): 3246-8, 2010 Oct 01.
Article in English | MEDLINE | ID: mdl-20890348

ABSTRACT

Fast, compact, and power-efficient silicon microcavity electro-optic modulators are expected to be critical components for chip-level optical interconnects. It is highly desirable that these modulators can be driven by voltage swings of 1 V or less to reduce power dissipation and make them compatible with voltage supply levels associated with current and future complementary metal-oxide-semiconductor technology nodes. Here, we present a silicon racetrack resonator modulator that achieves over 8 dB modulation depth at 12.5 Gbps with a 1 V swing. In addition, the use of a racetrack resonator geometry relaxes the tight lithography resolution requirements typically associated with microring resonators and enhances the ability to use common lithographic optical techniques for their fabrication.

7.
Opt Express ; 18(14): 14474-9, 2010 Jul 05.
Article in English | MEDLINE | ID: mdl-20639932

ABSTRACT

We demonstrate low loss shallow-ridge silicon waveguides with an average propagation loss of 0.274 + or - 0.008 dB/cm in the C-band (1530 nm - 1565 nm). These waveguides have a cross section of 0.25 microm by 2 microm and are fabricated by standard photolithography and dry etching. We also investigate a compact double-level taper which adiabatically couples light from these waveguides to silicon strip waveguides enabling tight bends.

8.
Opt Express ; 18(8): 7994-9, 2010 Apr 12.
Article in English | MEDLINE | ID: mdl-20588642

ABSTRACT

We demonstrate a very efficient high speed silicon modulator with an ultralow pi-phase-shift voltage-length product V(pi)L = 1.4V-cm. The device is based on a Mach-Zehnder interferometer (MZI) fabricated using 0.25microm thick silicon-on-insulator (SOI) waveguide with offset lateral PN junctions. Optimal carrier-depletion induced index change has been achieved through the optimization of the overlap region of carriers and photons. The 3dB bandwidth of a typical 1mm long device was measured to be more than 12GHz. An eye-diagram taken at a transmission rate of 12.5Gb/s confirms the high speed capability of the device.

9.
Opt Express ; 18(11): 10941-6, 2010 May 24.
Article in English | MEDLINE | ID: mdl-20588949

ABSTRACT

We present a wavelength-tunable, compact, high speed and low power silicon microring modulator. With a ring radius of 5 microm, we demonstrate a modulator with a high speed of 12.5 Gbps and a driving voltage of 3 V to achieve approximately 6 dB extinction ratio in high speed measurement. More importantly, tunability of the resonant wavelength is accomplished by means of a microheater on top of the ring, with an efficiency of 2.4 mW/nm (2.4 mW is needed to tune the resonant wavelength by 1 nm). This device aims to solve the narrow bandwidth problem of silicon microcavity modulators and increase the data bandwidth in optical interconnect systems.


Subject(s)
Heating/instrumentation , Refractometry/instrumentation , Silicon , Telecommunications/instrumentation , Transducers , Equipment Design , Equipment Failure Analysis , Miniaturization
10.
Opt Express ; 18(1): 96-101, 2010 Jan 04.
Article in English | MEDLINE | ID: mdl-20173827

ABSTRACT

We report a vertical p-i-n thin-film germanium photodetector integrated on 3microm thick large core silicon-on-insulator (SOI) waveguides. The device demonstrates very high external responsivity due to the low fiber coupling loss to the large core waveguides. The germanium width and thickness are carefully designed to achieve high responsivity yet retain high-speed performance. Even with fiber coupling loss included, the device has demonstrated greater than 0.7A/W external responsivity at 1550nm for TM polarization and 0.5A/W for TE polarization. A low dark current of 0.2microA at -0.5V bias is reported. 3dB bandwidths of 12GHz and 8.3GHz at -2.5V bias are also reported for 100microm and 200microm long devices, respectively. The device can cover the communication wavelength spectrum up to 1620nm with a relatively flat responsivity of >0.5A/W. Further studies suggest that with a modified design the device is capable of achieving 1A/W external responsivity for both TE and TM polarizations and greater than 30GHz bandwidth.


Subject(s)
Optical Devices , Photometry/instrumentation , Refractometry/instrumentation , Semiconductors , Silicon/chemistry , Equipment Design , Equipment Failure Analysis , Light , Systems Integration
11.
Opt Express ; 17(25): 22484-90, 2009 Dec 07.
Article in English | MEDLINE | ID: mdl-20052172

ABSTRACT

We present a high-speed silicon optical modulator with a low V(pp) (peak-to-peak driving voltage) and ultralow energy consumption based on a microring resonator, with the refractive index modulation achieved by electric-field-induced carrier depletion in a reverse-biased lateral pn diode embedded in the ring structure. With a V(pp) of 2 V, we demonstrate a silicon modulator with a 3 dB bandwidth of 11 GHz, a modulation depth of 6.5 dB together with an insertion loss of 2 dB, ultralow energy consumption of 50 fJ per bit, and a small device active area of approximately 1000 microm(2).


Subject(s)
Lenses , Refractometry/instrumentation , Semiconductors , Signal Processing, Computer-Assisted/instrumentation , Silicon/chemistry , Telecommunications/instrumentation , Computer-Aided Design , Electronics , Equipment Design , Equipment Failure Analysis
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