Three-dimensional microstructural imaging of sulfur poisoning-induced degradation in a Ni-YSZ anode of solid oxide fuel cells.

Following exposure to ppm-level hydrogen sulfide at elevated temperatures, a section of a solid oxide fuel cell (SOFC) Ni-YSZ anode was examined using a combination of synchrotron-based x-ray nanotomography and x-ray fluorescence techniques. While fluorescence measurements provided elemental identification and coarse spatial mapping, x-ray nanotomography was used to map the detailed 3-D spatial distribution of Ni, YSZ, and a nickel-sulfur poisoning phase. The nickel-sulfur layer was found to form a scale covering most of the exposed nickel surface, blocking most fuel reformation and hydrogen oxidation reaction sites. Although the exposure conditions precluded the ability to develop a detailed kinetic description of the nickel-sulfur phase formation, the results provide strong evidence of the detrimental effects of 100 ppm hydrogen sulfide on typical Ni-YSZ anode materials.

Three-dimensional microstructural imaging methods for energy materials.

Advances in the design of materials for energy storage and conversion (i.e., "energy materials") increasingly rely on understanding the dependence of a material's performance and longevity on three-dimensional characteristics of its microstructure. Three-dimensional imaging techniques permit the direct measurement of microstructural properties that significantly influence material function and durability, such as interface area, tortuosity, triple phase boundary length and local curvature. Furthermore, digital representations of imaged microstructures offer realistic domains for modeling. This article reviews state-of-the-art methods, across a spectrum of length scales ranging from atomic to micron, for three-dimensional microstructural imaging of energy materials. The review concludes with an assessment of the continuing role of three-dimensional imaging in the development of novel materials for energy applications.

Quantitative x-ray phase imaging at the nanoscale by multilayer Laue lenses.

For scanning x-ray microscopy, many attempts have been made to image the phase contrast based on a concept of the beam being deflected by a specimen, the so-called differential phase contrast imaging (DPC). Despite the successful demonstration in a number of representative cases at moderate spatial resolutions, these methods suffer from various limitations that preclude applications of DPC for ultra-high spatial resolution imaging, where the emerging wave field from the focusing optic tends to be significantly more complicated. In this work, we propose a highly robust and generic approach based on a Fourier-shift fitting process and demonstrate quantitative phase imaging of a solid oxide fuel cell (SOFC) anode by multilayer Laue lenses (MLLs). The high sensitivity of the phase to structural and compositional variations makes our technique extremely powerful in correlating the electrode performance with its buried nanoscale interfacial structures that may be invisible to the absorption and fluorescence contrasts.

Zone-doubled Fresnel zone plates for high-resolution hard X-ray full-field transmission microscopy.

Full-field transmission X-ray microscopy is a unique non-destructive technique for three-dimensional imaging of specimens at the nanometer scale. Here, the use of zone-doubled Fresnel zone plates to achieve a spatial resolution better than 20 nm in the hard X-ray regime (8-10 keV) is reported. By obtaining a tomographic reconstruction of a Ni/YSZ solid-oxide fuel cell, the feasibility of performing three-dimensional imaging of scientifically relevant samples using such high-spatial-resolution Fresnel zone plates is demonstrated.

Focused ion beam preparation of samples for X-ray nanotomography.

The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X-ray nanotomography requires that samples are sufficiently thin for X-rays to pass through the sample during rotation for tomography. One method for producing samples that fit the criteria for X-ray nanotomography is focused ion beam/scanning electron microscopy (FIB/SEM) which uses a focused beam of ions to selectively mill around a region of interest and then utilizes a micromanipulator to remove the milled-out sample from the bulk material and mount it on a sample holder. In this article the process for preparing X-ray nanotomography samples in multiple shapes and sizes is discussed. Additionally, solid-oxide fuel cell anode samples prepared through the FIB/SEM technique underwent volume-independence studies for multiple properties such as volume fraction, average particle size, tortuosity and contiguity to observe the characteristics of FIB/SEM samples in X-ray nanotomography.