ABSTRACT
Temperature measurement is one of the important factors for ensuring product quality, reducing production cost and ensuring experiment safety in industrial manufacture and scientific experiment. Radiation thermometry is the main method for non-contact temperature measurement. The second measurement (SM) method is one of the common methods in the multispectral radiation thermometry. However, the SM method cannot be applied to on-line data processing. To solve the problems, a rapid inversion method for multispectral radiation true temperature measurement is proposed and constraint conditions of emissivity model are introduced based on the multispectral brightness temperature model. For non-blackbody, it can be drawn that emissivity is an increasing function in the interval if the brightness temperature is an increasing function or a constant function in a range and emissivity satisfies an inequality of emissivity and wavelength in that interval if the brightness temperature is a decreasing function in a range, according to the relationship of brightness temperatures at different wavelengths. The construction of emissivity assumption values is reduced from multiclass to one class and avoiding the unnecessary emissivity construction with emissivity model constraint conditions on the basis of brightness temperature information. Simulation experiments and comparisons for two different temperature points are carried out based on five measured targets with five representative variation trends of real emissivity. decreasing monotonically, increasing monotonically, first decreasing with wavelength and then increasing, first increasing and then decreasing and fluctuating with wavelength randomly. The simulation results show that compared with the SM method, for the same target under the same initial temperature and emissivity search range, the processing speed of the proposed algorithm is increased by 19.16%-43.45% with the same precision and the same calculation results.
ABSTRACT
The intensity of broadband illuminant fluctuates when its' power supply output power changes. Spectral intensities at each wavelength within the band of broadband illuminant fluctuate at different levels. A method based on spectrum linear fitting is proposed to compensate the illuminant spectral intensity in its band when its intensity fluctuates. The spectral intensity fluctuation at each wavelength could be compensated simply by measuring the band intensity with this method. The linear relationship between spectral radiant exitance and whole radiant exitance of ideal blackbody was analysed by researching the radiant exitance at different temperatures. The linear model of broadband illuminant band intensity and spectral intensity was built. Experimental system is composed of a halogen light, a power supply, an aperture, a spectrometer, and a computer mainly. By adjusting the power output of the power supply, we obtained a set of halogen light relative spectral intensities at different power inputs. The spectral intensity of halogen light at different input powers was measured to test the compensation effect of this method. The relationship between spectral intensity and band intensity of halogen light was fitted with linear relation and the fitting errors were analysed. The experimental result shows a linear relationship between spectral intensity and band intensity of halogen light, so the spectral intensity fluctuation can be compensated using the band intensity according to their linear relation. The relative error absolute value of compensated spectral intensity decreases as the halogen light input power increases. Within the range of halogen light input power, the relative error absolute values of spectral intensity compensated with this method are within 5% at vast majority (92%) of the wavelengths.
