1.
Rev Sci Instrum
; 84(10): 104702, 2013 Oct.
Article
in English
| MEDLINE
| ID: mdl-24182139
ABSTRACT
We present a novel method for device noise measurement, based on a two-channel cross-correlation technique and a direct "in situ" measurement of the transimpedance of the device under test (DUT), which allows improved accuracy with respect to what is available in the literature, in particular when the DUT is a nonlinear device. Detailed analytical expressions for the total residual noise are derived, and an experimental investigation of the increased accuracy provided by the method is performed.