ABSTRACT
We report on the crystal structure, phase stability, surface morphology, microstructure, chemical bonding, and electronic properties of gallium oxide (Ga2O3) nanofibers made by a simple and economically viable electrospinning process. The effect of processing parameters on the properties of Ga2O3 nanofibers were evaluated by scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy (XPS), and Raman spectroscopy. Thermal treatments in the range of 700-900 °C induce crystallization of amorphous fibers and lead to phase stabilization of α-GaOOH, ß-Ga2O3, or mixtures of these phases. The electron diffraction analyses coupled with XPS indicate that the transformation sequence progresses by forming amorphous fibers, which then transform to crystalline fibers with a mixture of α-GaOOH and ß-Ga2O3 at intermediate temperatures and fully transforms to the ß-Ga2O3 phase at higher temperatures (800-900 °C). Raman spectroscopic analyses corroborate the structural evolution and confirm the high chemical quality of the ß-Ga2O3 nanofibers. The surface analysis by XPS studies indicates that the hydroxyl groups are present for the as-synthesized samples, while thermal treatment at higher temperatures fully removes those hydroxyl groups, resulting in the formation of ß-Ga2O3 nanofibers.
ABSTRACT
Molybdenum (Mo), which is one among the refractory metals, is a promising material with a wide variety of technological applications in microelectronics, optoelectronics, and energy conversion and storage. However, understanding the structure-property correlation and optimization at the nanoscale dimension is quite important to meet the requirements of the emerging nanoelectronics and nanophotonics. In this context, we focused our efforts to derive a comprehensive understanding of the nanoscale structure, phase, and electronic properties of nanocrystalline Mo films with variable microstructure and grain size. Molybdenum films were deposited under varying temperature (25-500 °C), which resulted in Mo films with variable grain size of 9-22 nm. The grazing incidence X-ray diffraction analyses indicate the (110) preferred growth behavior the Mo films, though there is a marked decrease in hardness and elastic modulus values. In particular, there is a sizable difference in maximum and minimum elastic modulus values; the elastic modulus decreased from ~460 to 260-280 GPa with increasing substrate temperature from 25-500 °C. The plasticity index and wear resistance index values show a dramatic change with substrate temperature and grain size. Additionally, the optical properties of the nanocrystalline Mo films evaluated by spectroscopic ellipsometry indicate a marked dependence on the growth temperature and grain size. This dependence on grain size variation was particularly notable for the refractive index where Mo films with lower grain size fell in a range between ~2.75-3.75 across the measured wavelength as opposed to the range of 1.5-2.5 for samples deposited at temperatures of 400-500 °C, where the grain size is relatively higher. The conductive atomic force microscopy (AFM) studies indicate a direct correlation with grain size variation and grain versus grain boundary conduction; the trend noted was improved electrical conductivity of the Mo films in correlation with increasing grain size. The combined ellipsometry and conductive AFM studies allowed us to optimize the structure-property correlation in nanocrystalline Mo films for application in electronics and optoelectronics.
