ABSTRACT
This article presents measurements of the piezoelectric modulus d 11 of a single crystal of lanthanum gallium silicate (LGS, La3Ga5SiO14). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative changes in the lattice constant in crystals caused by external influences (constant or alternating electric field, mechanical load, temperature change etc.). The development opportunity of the technique is shown, its applicability is evaluated and results of measurement of the LGS single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π are discussed.
ABSTRACT
Time-resolved technique of X-ray diffraction curve measurement was implemented at a laboratory X-ray source using a high-speed data acquisition system. The time resolution of up to 100 µs was achieved via this X-ray diffractometry technique in the experiment of rocking curve dynamics measurement in a piezoelectric lanthanum-gallium silicate crystal under the influence of high voltage periodic pulsed electric field with an amplitude of 3.08 kV/mm corresponding to the pre-breakdown state. This perturbation caused a quick angular shift of the rocking curve caused by crystal lattice deformation due to the piezoelectric effect. The absence of the diffraction curve broadening effect was shown as well as the absence of the other significant relaxation-like variations of the curve parameters which are inherent for the migration of charge carriers (ions or vacancies) under the external electric field.
