ABSTRACT
Potassium dihydrogen phosphate (KDP) and its deuterated analog (DKDP) are unique nonlinear optical materials for high power laser systems. They are used widely for frequency conversion and polarization control by virtue of the ability to grow optical-quality crystals at apertures suitable for fusion-class laser systems. Existing methods for freeform figuring of KDP/DKDP optics do not produce surfaces with sufficient laser-induced-damage thresholds (LIDT's) for operation in the ultraviolet portion of high-peak-power laser systems. In this work, we investigate fluid jet polishing (FJP) using a nonaqueous slurry as a sub-aperture finishing method for producing freeform KDP surfaces. This method was used to selectively polish surface areas to different depths on the same substrate with removals ranging from 0.16 µm to 5.13 µm. The finished surfaces demonstrated a slight increase in roughness as the removal depth increased along with a small number of fracture pits. Laser damage testing with 351 nm, 1 ns pulses demonstrated excellent surface damage thresholds, with the highest values in areas devoid of fracture pits. This work demonstrates, for the first time, a method that enables fabrication of a waveplate that provides tailored polarization randomization that can be scaled to meter-sized optics. Furthermore, this method is based on FJP technology that incorporates a nonaqueous slurry specially designed for use with KDP. This novel nonaqueous FJP process can be also used for figuring other types of materials that exhibit similar challenging inherent properties such as softness, brittleness, water-solubility, and temperature sensitivity.
ABSTRACT
Interactions of liquid crystals (LC's) with polarized light have been studied widely and have spawned numerous device applications, including the fabrication of optical elements for high-power and large-aperture laser systems. Currently, little is known about both the effect of incident polarization state on laser-induced-damage threshold (LIDT) and laser-induced functional threshold (LIFT) behavior at sub-LIDT fluences under multipulse irradiation conditions. This work reports on the first study of the nanosecond-pulsed LIDT's dependence on incident polarization for several optical devices employing oriented nematic and chiral-nematic LC's oriented by surface alignment layers. Accelerated lifetime testing was also performed to characterize the ability of these devices to maintain their functional performance under multipulse irradiation as a function of the laser fluence at both 1053 nm and 351 nm. Results show that the LIDT varies as a function of input polarization by 30-80% within the same device, while the multipulse LIFT (which can differ from the nominal LIDT) depends on irradiation conditions such as laser fluence and wavelength.
ABSTRACT
A low-temperature chemical cleaning approach has been developed to improve the performance of multilayer dielectric pulse-compressor gratings for use in the OMEGA EP laser system. X-ray photoelectron spectroscopy results guided the selection of targeted cleaning steps to strip specific families of manufacturing residues without damaging the grating's fragile 3D profile. Grating coupons that were cleaned using the optimized method consistently met OMEGA EP requirements on diffraction efficiency and 1054 nm laser-damage resistance at 10 ps. The disappearance of laser-conditioning effects for the highest-damage-threshold samples suggests a transition from a contamination-driven laser-damage mechanism to defect-driven damage for well-cleaned components.
ABSTRACT
Polymer cholesteric liquid-crystal flakes suspended in a fluid with nonnegligible conductivity can exhibit motion in the presence of an ac electric field. The plateletlike particles with a Grandjean texture initially lie parallel to the cell substrates and exhibit a strong selective reflection that is diminished or extinguished as the flakes move. Flake motion was seen within a specific frequency bandwidth in an electric field as low as 5 mV(rms)/microm. Flakes reoriented about their longest axis to align parallel to theapplied field, and a rise time of 560 ms was seen in a 40-mV(rms)/microm field at 100 Hz.
ABSTRACT
We compare the phase measurements of a fused-silica witness sample made with a liquid-crystal point-diffraction interferometer (LCPDI) with measurements made with a Zygo Mark IV xp phase-shifting interferometer and find close agreement. Two phase-shift-error sources in the LCPDI that contribute to measurement discrepancies are frame-to-frame intensity changes caused by the dichroism of the dye and alignment distortions of the host liquid crystal. An empirical model of the phase-shift error caused by the host alignment distortions is presented and used to investigate the performance of two different phase-detection algorithms. It is suggested that by proper choice of LCPDI fabrication parameters and phase-acquisition methods, the device's accuracy can be significantly improved.