ABSTRACT
Laser surface texturing (LST) is one of the most promising technologies for controllable surface structuring and the acquisition of specific physical surface properties needed in functional surfaces. The quality and processing rate of the laser surface texturing strongly depend on the correct choice of a scanning strategy. In this paper, a comparative review of the classical and recently developed scanning strategies of laser surface texturing is presented. The main attention is paid to maximal processing rate, precision and existing physical limitations. Possible ways of further development of the laser scanning strategies are proposed.
ABSTRACT
A shifted laser surface texturing method (sLST) was developed for the improvement of the production speed of functional surface textures to enable their industrial applicability. This paper compares the shifted method to classic methods using a practical texturing example, with a focus on delivering the highest processing speed. The accuracy of the texture is assessed by size and circularity measurements with the use of LabIR paint and by a depth profile measurement using a contact surface profiler. The heat accumulation temperature increase and laser usage efficiency were also calculated. The classic methods (path filling and hatch) performed well (deviation ≤ 5%) up to a certain scanning speed (0.15 and 0.7 m/s). For the shifted method, no scanning speed limit was identified within the maximum of the system (8 m/s). The depth profile shapes showed similar deviations (6% to 10%) for all methods. The shifted method in its burst variant achieved the highest processing speed (11 times faster, 146 mm2/min). The shifted method in its path filling variant achieved the highest processing efficiency per needed laser power (64 mm2/(min·W)), lowest heat accumulation temperature increase (3 K) and highest laser usage efficiency (99%). The advantages of the combination of the shifted method with GHz burst machining and the multispot approach were described.
ABSTRACT
Coatings deposited on a material surface are effective way of changing its surface properties. For increasing or decreasing radiation heat transfer, coatings with high or low emissivity are used. Measurement of spectral emissivity is a fundamental step to effective use of coatings for this application. Up to now the measurement methods are focused on bulk samples and mainly opaque ones. Here we present a method enabling measurement of emissivity of semitransparent coating itself, although it is deposited on a substrate. The method is based on measurement of transmittance and reflectance using an integration sphere system and Fourier transform infrared (FTIR) spectrometer for samples with two different coating thicknesses deposited on transparent substrates. Measured transmittance of the coating indicates spectral regions of potential emissivity differences using different substrates. From all the measured values, spectral emissivity can be characterized for different coating thicknesses. The spectral range of the method is from 2 µm to 20 µm. The measurement is done at ambient temperature enabling measurement of samples sensitive to heating like biomedical or nanocoatings. The method was validated on known bulk samples and an example of semitransparent coating measurement is shown on high-temperature high-emissivity coating.
