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1.
Nano Lett ; 14(9): 5085-91, 2014 Sep 10.
Article in English | MEDLINE | ID: mdl-25102168

ABSTRACT

We demonstrate self-patterned insulating nanoparticle layers to define local electrical interconnects in thin-film electronic devices. We show this with thin-film silicon tandem solar cells, where we introduce between the two component cells a solution-processed SiO2 nanoparticle layer with local openings to allow for charge transport. Because of its low refractive index, high transparency, and smooth surface, the SiO2 nanoparticle layer acts as an excellent intermediate reflector allowing for efficient light management.

2.
Nano Lett ; 12(3): 1344-8, 2012 Mar 14.
Article in English | MEDLINE | ID: mdl-22332666

ABSTRACT

The challenge for all photovoltaic technologies is to maximize light absorption, to convert photons with minimal losses into electric charges, and to efficiently extract them to the electrical circuit. For thin-film solar cells, all these tasks rely heavily on the transparent front electrode. Here we present a multiscale electrode architecture that allows us to achieve efficiencies as high as 14.1% with a thin-film silicon tandem solar cell employing only 3 µm of silicon. Our approach combines the versatility of nanoimprint lithography, the unusually high carrier mobility of hydrogenated indium oxide (over 100 cm(2)/V/s), and the unequaled light-scattering properties of self-textured zinc oxide. A multiscale texture provides light trapping over a broad wavelength range while ensuring an optimum morphology for the growth of high-quality silicon layers. A conductive bilayer stack guarantees carrier extraction while minimizing parasitic absorption losses. The tunability accessible through such multiscale electrode architecture offers unprecedented possibilities to address the trade-off between cell optical and electrical performance.


Subject(s)
Electric Power Supplies , Electrodes , Nanostructures/chemistry , Nanostructures/ultrastructure , Nanotechnology/instrumentation , Solar Energy , Equipment Design , Equipment Failure Analysis , Light , Particle Size , Refractometry , Scattering, Radiation
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