ABSTRACT
The complex refractive index of many materials is poorly known in the soft X-ray range across absorption edges. This is due to saturation effects that occur there in total-electron-yield and fluorescence-yield spectroscopy and that are strongest at resonance energies. Aiming to obtain reliable optical constants, a procedure that reconciles electron-yield measurements and reflection spectroscopy by correcting these saturation effects is presented. The procedure takes into account the energy- and polarization-dependence of the photon penetration depth as well as the creation efficiency for secondary electrons and their escape length. From corrected electron-yield spectra the absorption constants and the imaginary parts of the refractive index of the material are determined. The real parts of the index are subsequently obtained through a Kramers-Kronig transformation. These preliminary optical constants are refined by simulating reflection spectra and adapting them, so that measured reflection spectra are reproduced best. The efficacy of the new procedure is demonstrated for graphite. The optical constants that have been determined for linearly polarized synchrotron light incident with p- and s-geometry provide a detailed and reliable representation of the complex refractive index of the material near π- and σ-resonances. They are also suitable for allotropes of graphite such as graphene.
ABSTRACT
The existence of the x-ray magneto-optical Voigt effect is demonstrated. By means of polarization analysis the Voigt rotation and ellipticity of linearly polarized synchrotron radiation are measured at the Co L3 edge upon transmission through an amorphous Co film. The observed x-ray Voigt rotation is about 7.5 degrees /microm. On the basis of ab initio calculations it is shown that the x-ray Voigt effect follows sensitively the amount of spin polarization of the 2p core states. Therefore it provides a unique measure of the spin splitting of the core states.
ABSTRACT
The design of a versatile high-precision eight-axis ultrahigh-vacuum-compatible polarimeter is presented. This multipurpose instrument can be used as a self-calibrating polarization detector for linearly and circularly polarized UV and soft-x-ray light. It can also be used for the characterization of reflection or transmission properties (reflectometer) or polarizing and phase-retarding properties (ellipsometer) of any optical element. The polarization properties of Mo/Si, Cr/C, Cr/Sc, and Ni/Ti multilayers used in this polarimeter as polarizers in transmission and as analyzers in reflection have been investigated theoretically and experimentally. In the soft-x-ray range, close to the p edges of Sc, Ti, and Cr, resonantly enhanced phase retardation of the transmission polarizers of as much as 18 degrees has been measured. With these newly developed optical elements the complete polarization analysis of soft-x-ray synchrotron radiation can be extended to the water-window range from 300 to 600 eV.
ABSTRACT
We have systematically investigated ultrathin Cr/Sc multilayers (nanolayers), using tunable soft-x-ray synchrotron radiation. The multilayers were optimized for use either in normal incidence or at 45 degrees at photon energies around the 2p-absorption edges of Sc (399 eV) and Cr (574 eV), respectively. They were sputter deposited on Si wafers or on thin Si(3)N(4)-membrane support structures for use in reflection and in transmission, respectively, as polarizing and phase-retarding elements in a polarimeter. The performance theoretically expected with respect to reflection/transmission and energy resolution has been confirmed experimentally: A value of 7% for the normal-incidence peak reflectance at 395 eV was measured as well as a pronounced minimum in transmission for certain incidence angles and energies below the respective absorption edges, indicating significant phase-shifting effects.
ABSTRACT
An experimental investigation of W/C, W/Ti, Ni/Ti, and Ni/V multilayers is presented that uses synchrotron radiation in the soft-x-ray energy region between 100 and 1500 eV with special emphasison the water window. The multilayers were designed as normal incidence reflectors and for polarimetry purposes around the Brewster angle. Both reflection and transmission multilayers were prepared for use as linear polarizers and phase retarders, respectively, to produce or analyze circularly polarized light. Their period was optimized to achieve maximum reflectance at the 1s absorption edge of C (284 eV) and the 2p edges of Ti (454 eV) and V (512 eV), respectively. At these edges the multilayers show an enhancement of reflectance and energy resolution that is in accordance with theoretical calculations.
