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1.
ACS Appl Mater Interfaces ; 11(12): 11660-11666, 2019 Mar 27.
Article in English | MEDLINE | ID: mdl-30810028

ABSTRACT

p-Type molecular doping of organic materials with high ionization energies (IEs) of above 5.50 eV is still a challenge, limiting the use of doping in high-performance organic light-emitting diodes (OLEDs). Here, we investigate the molecular dopant hexacyano-trimethylene-cyclopropane (CN6-CP) with a high electron affinity of 5.87 eV as p-dopant in OLEDs. We show that CN6-CP can be used not only as a dopant in the traditional hole transport material 4,4'-cyclohexylidenebis[ N, N-bis(4-methylphenyl)benzenamine] (TAPC, IE = 5.50 eV) but also effectively dopes the host material tris(4-carbazoyl-9-ylphenyl)amine (TCTA, IE = 5.85 eV), reaching a conductivity of 1.86 × 10-4 S/cm at a molar ratio of 0.25. Using CN6-CP-doped TAPC as hole injection and transport layer, we achieve a low driving voltage of 2.92 V at the practical brightness of 1000 cd/m2 and 3.18 V at a current density of 10 mA/cm2 for a green phosphorescent OLED based on bis[2-(2-pyridinyl- N)phenyl- C](acetylacetonato)iridium(III) (Ir(ppy)2(acac)), together with a maximum external quantum efficiency of 18% and a luminous efficacy of 78 lm/W. The device also exhibits a very low efficiency roll-off at high luminance. Further, by directly adopting CN6-CP-doped TCTA as the injection/transport layer, the driving voltage drops to 2.78 V at 1000 cd/m2 and 2.93 V at 10 mA/cm2. Moreover, conductivity and absorption measurements suggest that CN6-CP could also dope CBP with an IE as high as 6.05 eV. The results show that CN6-CP is an excellent p-type dopant for efficient OLEDs and possesses great potential for future application in organic optoelectronic devices.

2.
Nat Mater ; 18(3): 242-248, 2019 03.
Article in English | MEDLINE | ID: mdl-30692647

ABSTRACT

Doped organic semiconductors typically exhibit a thermal activation of their electrical conductivity, whose physical origin is still under scientific debate. In this study, we disclose relationships between molecular parameters and the thermal activation energy (EA) of the conductivity, revealing that charge transport is controlled by the properties of host-dopant integer charge transfer complexes (ICTCs) in efficiently doped organic semiconductors. At low doping concentrations, charge transport is limited by the Coulomb binding energy of ICTCs, which can be minimized by systematic modification of the charge distribution on the individual ions. The investigation of a wide variety of material systems reveals that static energetic disorder induced by ICTC dipole moments sets a general lower limit for EA at large doping concentrations. The impact of disorder can be reduced by adjusting the ICTC density and the intramolecular relaxation energy of host ions, allowing an increase of conductivity by many orders of magnitude.

3.
Nat Commun ; 9(1): 2356, 2018 06 12.
Article in English | MEDLINE | ID: mdl-29895823

ABSTRACT

The original version of this Article contained an error in Equation 1. A factor of 'c' was included in the right-hand term. This has been corrected in the PDF and HTML versions of the Article.

4.
Nat Commun ; 9(1): 1182, 2018 03 21.
Article in English | MEDLINE | ID: mdl-29563497

ABSTRACT

Fermi level control by doping is established since decades in inorganic semiconductors and has been successfully introduced in organic semiconductors. Despite its commercial success in the multi-billion OLED display business, molecular doping is little understood, with its elementary steps controversially discussed and mostly-empirical-materials design. Particularly puzzling is the efficient carrier release, despite a presumably large Coulomb barrier. Here we quantitatively investigate doping as a two-step process, involving single-electron transfer from donor to acceptor molecules and subsequent dissociation of the ground-state integer-charge transfer complex (ICTC). We show that carrier release by ICTC dissociation has an activation energy of only a few tens of meV, despite a Coulomb binding of several 100 meV. We resolve this discrepancy by taking energetic disorder into account. The overall doping process is explained by an extended semiconductor model in which occupation of ICTCs causes the classically known reserve regime at device-relevant doping concentrations.

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