Incoherent averaging of phase singularities in speckle-shearing interferometry.

Interferometric speckle techniques are plagued by the omnipresence of phase singularities, impairing the phase unwrapping process. To reduce the number of phase singularities by physical means, an incoherent averaging of multiple speckle fields may be applied. It turns out, however, that the results may strongly deviate from the expected √N behavior. Using speckle-shearing interferometry as an example, we investigate the mechanism behind the reduction of phase singularities, both by calculations and by computer simulations. Key to an understanding of the reduction mechanism during incoherent averaging is the representation of the physical averaging process in terms of certain vector fields associated with each speckle field.

Simultaneous measurement of phase and local orientation of linearly polarized light: implementation and measurement results.

Optical components manipulating both polarization and phase of wave fields find many applications in today's optical systems. With modern lithography methods it is possible to fabricate optical elements with nanostructured surfaces from different materials capable of generating spatially varying, locally linearly polarized-light distributions, tailored to the application in question. Since such elements in general also affect the phase of the light field, the characterization of the function of such elements consists in measuring the phase and the polarization of the generated light, preferably at the same time. Here, we will present first results of an interferometric approach for a simultaneous and spatially resolved measurement of both phase and polarization, as long as the local polarization at any point is linear (e.g., for radially or azimuthally polarized light).

Evaluation algorithms for multistep measurement of spatially varying linear polarization and phase.

Optical components manipulating both polarization and phase of wave fields find more and more applications in today's optical systems. In particular, the polarization orientation may vary across the aperture. New measurement techniques and evaluation algorithms are needed to simultaneously characterize the properties of such elements. In this Letter, a general measurement algorithm for locally linear polarization distributions is presented, extending the methods of phase shifting interferometry to the simultaneous determination of polarization and phase. A class of evaluation algorithms is derived, and some example algorithms are described and tested for their resilience against systematic and stochastic stepping errors.

Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters.

Parallel two-step phase-shifting point-diffraction interferometry for microscopy based on a pair of cube beamsplitters is proposed. The first 45°-tilted cube beamsplitter splits object wave into two parallel copies: one copy is filtered by a pinhole in its Fourier plane to behave as reference wave, while the other one remains unchanged as object wave. The second cube beamsplitter combines the object and reference waves, and then split them together into two beams. Along with the two beams, two parallel phase-shifting interferograms are obtained in aid of polarization elements. Based on the proposed configuration, slightly-off-axis interferometry for microscopy is performed, which suppresses dc term by subtracting the two phase-shifting holograms from each other. The setup is highly stable due to its common-path configuration, and has been demonstrated to be suitable for measuring moving objects or dynamic processes.

Diffractive simultaneous bidirectional shearing interferometry using tailored spatially coherent light.

Measurements of wavefront deformations can be carried out with the help of lateral shearing interferometers. Here the focus is on a setup providing two shears along orthogonal directions simultaneously to generate the data needed for a reconstruction. We describe a diffractive solution using Ronchi phase gratings with a suppressed zeroth order for both the doubling of the wavefront under test and the bidirectional shearing unit. A series arrangement of the gratings offers an on-axis geometry, which minimizes the systematic errors of the test. For illumination, an extended incoherent monochromatic light source is used. High-contrast fringes can be obtained by tailoring the degree of coherence via a periodic intensity distribution.

Phase-shifting point-diffraction interferometry with common-path and in-line configuration for microscopy.

A new common-path and in-line point-diffraction interferometer for quantitative phase microscopy is proposed. The interferometer is constructed by introducing a grating pair into the point-diffraction interferometer, thus forming a common-path and in-line configuration for object and reference waves. Achromatic phase shifting is implemented by linearly moving one of the two gratings in its grating vector direction. The feasibility of the proposed configuration is demonstrated by theoretical analysis and experiments.