ABSTRACT
The physical properties of electronic devices made by 2,6-diphenyl anthracene (DPA) are influenced by the microtexture of DPA surfaces. This work focused on the experimental investigation of the 3-D surface microtexture of DPA thin films deposited on OTS (octadecyltrichlorosilane), HMDS (Hexamethyldisilasane), OTMS (octadecyltrimethoxysilane), and Si/SiO2 (300 nm SiO2 thickness) substrates with 5 and 50 nm thicknesses and 5 and 10 µm scan size. The thin film surfaces were recorded using atomic force microscopy (AFM) and their images were stereometrically analyzed to obtain statistical parameters, in accordance with ASME B46.1-2009 and ISO 25178-2: 2012. The results showed the effect of different manufacturing parameters on microtexture values where the granular structure is confirmed in all films. In addition, root mean square is increased by increasing the thickness from 5 to 50 nm for all types of substrates.
ABSTRACT
This work describes an analysis of titanium dioxide (TiO2 ) thin films prepared on silicon substrates by direct current (DC) planar magnetron sputtering system in O2 /Ar atmosphere in correlation with three-dimensional (3D) surface characterization using atomic force microscopy (AFM). The samples were grown at temperatures 200, 300, and 400°C on silicon substrate using the same deposition time (30 min) and were distributed into four groups: Group I (as-deposited samples), Group II (samples annealed at 200°C), Group III (samples annealed at 300°C), and Group IV (samples annealed at 400°C). AFM images with a size of 0.95 µm × 0.95 µm were recorded with a scanning resolution of 256 × 256 pixels. Stereometric analysis was carried out on the basis of AFM data, and the surface topography was described according to ISO 25178-2:2012 and American Society of Mechanical Engineers (ASME) B46.1-2009 standards. The maximum and minimum root mean square roughnesses were observed in surfaces of Group II (Sq = 7.96 ± 0.1 nm) and Group IV (Sq = 3.87 ± 0.1 nm), respectively.
ABSTRACT
Determining surface topography of different tissues of the molar tooth with novel analytical methods has opened new horizons in dental surface measurements which characterize tooth surface quality in dentistry. Studying surface topological measurements and comparing surface morphology of hard tissue of the molar tooth are the ultimate goals of the present study. Ten molar teeth have been chosen for investigating their surface characteristics through image processing techniques. The power spectral density (PSD) and fast Fourier transform algorithms of every molar tooth containing enamel, dentin, and cementum have determined that the characterization of surface profiles is possible. As can be seen, PSD along with fractal dimensions leads to good results for teeth surface topography. Moreover, PSD angular plot assures appropriate description of surface.
