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1.
J Xray Sci Technol ; 5(1): 65-72, 1995 Jan 01.
Article in English | MEDLINE | ID: mdl-21307478

ABSTRACT

In the present work we have used the EXAFS and SAXS methods to study the inner structure of "classical" Co/C and Ni/C multilayers. This enabled us to study in detail the structure of a multilayer as a function of the thickness of a metal layer within the multilayer. On the basis of these data a model for multilayer growth produced with pulsed laser evaporation technology is proposed.

2.
J Xray Sci Technol ; 5(4): 389-95, 1995 Jan 01.
Article in English | MEDLINE | ID: mdl-21307508

ABSTRACT

A detailed study of structural changes occurring in films and on boundaries in multilayers upon annealing with EXAFS, WAXS, and SAXS methods was performed. The optimum temperature of annealing for the Ni/C and Co/C multilayers obtained by the pulsed laser evaporation method was found.

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