1.
Ned Tijdschr Geneeskd
; 135(38): 1730-5, 1991 Sep 21.
Article
in Dutch
| MEDLINE
| ID: mdl-1922527
2.
Appl Opt
; 29(15): 2320-4, 1990 May 20.
Article
in English
| MEDLINE
| ID: mdl-20563169
ABSTRACT
A theoretical method is described from which the thickness of an arbitrary layer in a dielectric multilayer stack is determined if all other thicknesses and all refractive indices are given, such that a prescribed effective index for a given mode of the stack is obtained. The same theory can determine the optimal cover thickness of such a stack for prism coupling. Experimental verification shows effective indices that are in agreement with the designed values.