ABSTRACT
Understanding dynamically-induced stochastic switching effects in soft ferromagnetic nanowires is a critical challenge for realising spintronic devices with deterministic switching behaviour. Here, we present a micromagnetic simulation protocol for qualitatively predicting dynamic stochastic domain wall (DW) pinning/depinning at artificial defect sites in Ni80Fe20 nanowires, and demonstrate its abilities by correlating its predictions with the results of focused magneto-optic Kerr effect measurements. We analyse DW pinning configurations in both thin nanowires (t = 10 nm) and thick nanowires (t = 40 nm) with both single (asymmetric) and double (symmetric) notches, showing how our approach provides understanding of the complex DW-defect interactions at the heart of stochastic pinning behaviours. Key results explained by our model include the total suppression of stochastic pinning at single notches in thick nanowires and the intrinsic stochasticity of pinning at double notches, despite their apparent insensitivity to DW chirality.
