ABSTRACT
We describe the design of a tandem instrument combining a low-energy electron microscope (LEEM) and a negative ion accelerator. This instrument provides video rate imaging of surface microtopography and the dynamics of its evolution during irradiation by energetic ions, at temperatures up to 1700 K. The negative ion beam is incident on the sample at normal incidence with impact energies selectable in the range 0-5 keV, and with current densities up to 30 muA/cm2 ( approximately 2 x 10(14)ions/cm2 s or approximately 0.2 ML/s). The LEEM operates at a base pressure in the 10(-9)Pa range. We describe the design and operating principles of the instrument and present examples of Pt(111) and Si(001) self-ion irradiation experiments.
Subject(s)
Microscopy, Electron/instrumentation , Anions , Image Enhancement , Radiation , Silicon/analysisABSTRACT
We report scanning tunneling microscopy and low energy electron microscopy (LEEM) observations for thin films of Nb (011) of stripe-phase behavior by two variants of an O-induced reconstruction. Stripes occur for thin films but not bulk crystals. At low temperatures the less-favored variant is thermally activated as single stripes on surface heterogeneities. Near T0 = 1505 K, where the reconstruction is lifted, the stripes crowd to form a periodic array with a temperature dependent spacing. LEEM permits quantitative insight into stripe behavior and reveals novel details of stripes interacting with topographic features such as steps, facets, and dislocations.
