ABSTRACT
In this paper, a new sensor is developed to estimate the dielectric constant of Cyclo Olefin Polymer (COP) film utilizable for 5G mobile phones' multi-layered back-cover. It is featured by the electrical characterization of the thin layer of the COP film at 28 GHz as the material under test (MUT) directly contacting the planar probe (which is an array of resonating patches) and a new meta-surface as metal patterned on the COP film inserted between the planar probe and the 5G multi-layered back-cover for enhanced physical interpretation of the data by way of impedance matching. In this approach to delving into the material, a thin and small meta-surface film with an area of 25.65 × 21.06 mm2 and a thickness of 55 µm is examined for applications to 5G mobile 28 GHz-frequency communication on the basis of the below -10 dB-impedance matching for the 1-by-4 array sensor. Along with this, the real and commercial handset back-cover is brought to the test. The proposed method presents the advantages of geometrical adequacy to the realistic 5G handset antenna configuration, the idea of impedance-matching via meta-materials, and the suitability of characterizing the film-type structure as compared to the open-ended coaxial waveguide, waveguide-to-waveguide and TX horn-to-RX horn free-space test methods.
