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1.
Rev Sci Instrum ; 83(2): 02A507, 2012 Feb.
Article in English | MEDLINE | ID: mdl-22380203

ABSTRACT

We report on experiments with a new superconducting electron beam ion source (EBIS-SC), the Dresden EBIS-SC, with the objective to meet the main requirements for their application in particle-therapy facilities. Synchrotrons as well as innovative accelerator concepts, such as high-gradient linacs which are driven by a large-current cyclotron (CYCLINACS) and direct drive RF linear accelerators may benefit from the advantages of EBISs in regard to their functional principle. First experimental studies of the production of low-Z ions such as H(+), H(2)(+), H(3)(+), C(4+), and C(6+) are presented. Particular attention is paid to the ion output, i.e., the number of ions per pulse and per second, respectively. Important beam parameters in this context are, among others, ion pulse shaping, pulse repetition rates, beam emittance, and ion energy spread.


Subject(s)
Electric Conductivity , Electrons/therapeutic use , Radiometry/instrumentation , Radiotherapy/instrumentation , Carbon/therapeutic use , Hydrogen , Proton Therapy
2.
Rev Sci Instrum ; 81(2): 02A512, 2010 Feb.
Article in English | MEDLINE | ID: mdl-20192367

ABSTRACT

We give an overview about latest developments and measurements with the Dresden electron beam ion source family as compact and economically working table-top sources of highly charged ions. The ion sources are potential tools for various applications such as for use in combination with accelerators in medical particle therapy, as charge breeder or ion trap injector, as ion sources for a new generation of focused ion beam devices and for applications together with time-of-flight secondary mass spectrometers.

3.
Rev Sci Instrum ; 79(8): 083302, 2008 Aug.
Article in English | MEDLINE | ID: mdl-19044341

ABSTRACT

The evolution of the charge state distribution inside an electron beam ion source or trap (EBIS/T) is determined by interactions of the electron beam with the ions in the trap region. Hence, detailed information about the electron beam is required for evaluations of spectroscopic and ion extraction measurements performed at EBIS/T facilities. This article presents the results of investigations on the electron beam properties of an ion source of the Dresden EBIS type. For the first time theoretical predictions of the shape of the beam were tested for a noncryogenic EBIS working with low magnetic flux densities provided by permanent magnets. Position and width of the electron beam were measured at different electron energies showing an oscillation in the beam structure. At an energy of E(e)=16 keV and an emission current of I(e)=30 mA the beam is compressed to a radius of r(e)=57 mum (80% current). This refers to an average current density of j(e)=232 A/cm(2).

4.
Rev Sci Instrum ; 79(2 Pt 2): 02A703, 2008 Feb.
Article in English | MEDLINE | ID: mdl-18315151

ABSTRACT

The Dresden electron beam ion trap (EBIT)/electron beam ion source (EBIS) family are very compact and economically working table-top ion sources. We report on the development of three generations of such ion sources, the so-called Dresden EBIT, Dresden EBIS, and Dresden EBIS-A, respectively. The ion sources are classified by different currents of extractable ions at different charge states and by the x-ray spectra emitted by the ions inside the electron beam. We present examples of x-ray measurements and measured ion currents extracted from the ion sources at certain individual operating conditions. Ion charge states of up to Xe(48+) but also bare nuclei of lighter elements up to nickel have been extracted. The application potential of the ion sources is demonstrated via proof-of-concept applications employing an EBIT in a focused ion beam (FIB) column or using an EBIT for the production of nanostructures by single ion hits. Additionally we give first information about the next generation of the Dresden EBIS series. The so-called Dresden EBIS-SC is a compact and cryogen-free superconducting high-B-field EBIS for high-current operation.

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