Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.

Frequency-modulation atomic force microscopy (AFM) with a qPlus sensor allows one to atomically resolve surfaces in a variety of environments ranging from low-temperature in ultra-high vacuum to ambient and liquid conditions. Typically, the tip is driven to oscillate vertically, giving a measure of the vertical force component. However, for many systems, the lateral force component provides valuable information about the sample. Measuring lateral and vertical force components simultaneously by oscillating vertically and laterally has so far only been demonstrated with relatively soft silicon cantilevers and optical detection. Here, we show that the qPlus sensor can be used in a biaxial mode with electrical detection by making use of the first flexural mode and the length extensional mode. We describe the necessary electrode configuration as well as the electrical detection circuit and compare the length extensional mode to the needle sensor. Finally, we show atomic resolution in ambient conditions of a mica surface and in ultra-high vacuum of a silicon surface. In addition to this, we show how any qPlus AFM setup can be modified to work as a biaxial sensor, allowing two independent force components to be recorded.

Determining amplitude and tilt of a lateral force microscopy sensor.

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.

Combined atomic force microscope and scanning tunneling microscope with high optical access achieving atomic resolution in ambient conditions.

Performing atomic force microscopy (AFM) and scanning tunneling microscopy (STM) with atomic resolution under ambient conditions is challenging due to enhanced noise and thermal drift. We show the design of a compact combined atomic force and scanning tunneling microscope that uses qPlus sensors and discuss the stability and thermal drift. By using a material with a low thermal expansion coefficient, we can perform constant height measurements and achieve atomic resolution in both AFM and STM on various samples. Moreover, the design allows a wide angle optical access to the sensor and the sample that is of interest for combining with optical microscopes or focusing optics with a high numerical aperture.

Ion mobility and material transport on KBr in air as a function of the relative humidity.

Surfaces exposed to air can change their structure due to external influences such as chemical reactions or material exchange and movement. The adsorbed water layer that is present under ambient conditions plays an important role especially for highly soluble materials. Surface atoms can easily diffuse into the thin water layer and, when surface conditions are favorable, they can re-attach to the surface. We collected atomic force microscopy images of KBr surfaces in a humidity-controlled glove box at various relative humidities below 40%. By scratching and poking the surface with the AFM tip, we constructed energetically unfavorable holes or scratch sites and material accumulations and recorded the evolution of these defects as a function of the time. We observed an exponential decay of the size of the defects and material accumulations, and from this data we determined energy barriers to dissolution and aggregation of approximately 0.9 eV.

Imaging in Biologically-Relevant Environments with AFM Using Stiff qPlus Sensors.

High-resolution imaging of soft biological samples with atomic force microscopy (AFM) is challenging because they must be imaged with small forces to prevent deformation. Typically, AFM of those samples is performed with soft silicon cantilevers (k ≈ 0.1-10 N/m) and optical detection in a liquid environment. We set up a new microscope that uses a stiff qPlus sensor (k ≥ 1 kN/m). Several complex biologically-relevant solutions are non-transparent, and even change their optical properties over time, such as the cell culture medium we used. While this would be problematic for AFM setups with optical detection, it is no problem for our qPlus setup which uses electrical detection. The high stiffness of the qPlus sensor allows us to use small amplitudes in frequency-modulation mode and obtain high Q factors even in liquid. The samples are immersed in solution in a liquid cell and long tips are used, with only the tip apex submerged. We discuss the noise terms and compare the minimal detectable signal to that of soft cantilevers. Atomic resolution of muscovite mica was achieved in various liquids: H2O, Tris buffer and a cell culture medium. We show images of lipid membranes in which the individual head groups are resolved.