In Situ Smoothing of Facets on Spalled GaAs(100) Substrates during OMVPE Growth of III-V Epilayers, Solar Cells, and Other Devices: The Impact of Surface Impurities/Dopants.

One possible pathway toward reducing the cost of III-V solar cells is to remove them from their growth substrate by spalling fracture, and then reuse the substrate for the growth of multiple cells. Here we consider the growth of III-V cells on spalled GaAs(100) substrates, which typically have faceted surfaces after spalling. To facilitate the growth of high-quality cells, these faceted surfaces should be smoothed prior to cell growth. In this study, we show that these surfaces can be smoothed during organometallic vapor-phase epitaxy growth, but the choice of epilayer material and modification of the various surfaces by impurities/dopants greatly impacts whether or not the surface becomes smooth, and how rapidly the smoothing occurs. Representative examples are presented along with a discussion of the underlying growth processes. Although this work was motivated by solar cell growth, the methods are generally applicable to the growth of any III-V device on a nonplanar substrate.

Revealing the Pressure-Induced Phase Transformation of Xenotime TbPO4 via In Situ Photoluminescence Spectroscopy.

The pressure-induced phase transformations of certain rare earth (RE) orthophosphates have attracted broad interest from geoscience to structural ceramics. Studying these transformations has required in situ Raman spectroscopy or synchrotron X-ray diffraction (XRD), each of which suffers from poor signal or limited accessibility, respectively. This study exploits the photoluminescence (PL) of Tb3+ ions and the unique sensitivity of PL to the local bonding environment to interrogate the symmetry-reducing xenotime-monazite phase transformation of TbPO4. At pressures consistent with the XRD-based phase transformation onset pressure of 8.7(6) GPa, PL spectra show new peaks emerging as well as trend changes in the centroids and intensity ratios of certain PL bands. Furthermore, PL spectra of recovered samples show transformation is irreversible. Hysteresis in certain PL band intensity ratios also reveals the stress history in TbPO4. This in situ PL approach can be applied to probe pressure-induced transformations and crystal field distortions in other RE-based oxide compounds.

Characterization of Elastic Modulus Across the (Al1-xScx)N System Using DFT and Substrate-Effect-Corrected Nanoindentation.

Knowledge of accurate values of elastic modulus of (Al1-xScx)N is required for design of piezoelectric resonators and related devices. Thin films of (Al1-xScx)N across the entire composition space are deposited and characterized. Accuracy of modulus measurements is improved and quantified by removing the influence of substrate effects and by direct comparison of experimental results with density functional theory calculations. The 5%-30% Sc compositional range is of particular interest for piezoelectric applications and is covered at higher compositional resolution here than in previous work. The reduced elastic modulus is found to decrease by as much as 40% with increasing Sc concentration in the wurtzite phase according to both experimental and computational techniques, whereas Sc-rich rocksalt-structured films exhibit little variation in modulus with composition.

Patterned removal of molecular organic films by diffusion.

We demonstrate that "contact patterning" subtractively patterns a wide range of molecular organic films of nanoscale thickness with nanometer-scale accuracy. In "contact patterning", an elastomeric stamp with raised features is brought into contact with the organic film and subsequently removed, generating patterns by the diffusion of the film molecules into the stamp. The mechanism of material removal via diffusion is documented over spans of minutes, hours, and days and is shown to be consistently repeatable. Contact patterning provides a photolithography-free, potentially scalable approach to subtractive patterning of a wide range of molecular organic films.

Hot nanoindentation in inert environments.

An instrument capable of performing nanoindentation at temperatures up to 500 degrees C in inert atmospheres, including partial vacuum and gas near atmospheric pressures, is described. Technical issues associated with the technique (such as drift and noise) and the instrument (such as tip erosion and radiative heating of the transducer) are identified and addressed. Based on these considerations, preferred operation conditions are identified for testing on various materials. As a proof-of-concept demonstration, the hardness and elastic modulus of three materials are measured: fused silica (nonoxidizing), aluminum, and copper (both oxidizing). In all cases, the properties match reasonably well with published data acquired by more conventional test methods.