ABSTRACT
A high-magnification moiré interferometer has been constructed with a spatial resolution of the order of 1 microm to measure the local in-plane displacement field associated with a material's microstructure. Laser illumination passes through phase-stepping optics and is delivered to the microscope head by polarization-preserving single-mode optical fibres. The head itself is a compact unit consisting of collimating optics, an objective lens and a charge coupled device (CCD) camera. Thin-phase gratings are cast onto the sample surface with a compliant epoxy resin and coated with ca. 5 nm of gold to enhance the fringe contrast and reduce speckle noise. By switching between the laser illumination and white-light illumination, the underlying microstructure is viewed in exact registration with the measured displacement fields. The application of the instrument is illustrated here by visualization of displacement fields in polymer-bonded explosives (PBXs) during deformation to failure. PBXs are highly filled polymers consisting of up to 95% by weight crystalline explosive bound in a variety of polymeric binders. The mechanical properties of PBXs are highly dependent on the microstructure, and moiré interferometry is an ideal tool for investigating the relationship between the 1-100 microm sized crystals and the displacement fields. Methods such as this are required if computer models of inhomogeneous materials are to be accurately validated.
