The molecular structure ordering and orientation of the metallophthalocyanine CoPc, ZnPc, CuPc, and MgPc thin layers deposited on silicon substrate, as studied by micro-Raman spectroscopy.

In this article, we present orientation study of metallophthalocyanine (MPcs) (CoPc, ZnPc, CuPc, and MgPc) thin films deposited on silicon substrate. The MPc's thin layers were obtained by the quasi-molecular beam evaporation. The micro-Raman scattering spectra of MPc's thin films were investigated in the spectral range 550-1650 cm-1 using 488 nm excitation wavelength. Raman scattering studies were performed at room temperature before and after annealing process. Annealing process of thin layers was carried out at 200 °C for 6 h. From polarized Raman spectra using surface Raman mapping, the information on polymorphic phase of MPc's layers has been obtained. The chosen Raman modes A1g and B1g are connected with different polymorphic phases of MPc (α and ß form) thin layers. Moreover, the obtained results showed the influence of the annealing process on the ordering of the molecular structure. Following the annealing process, it was observed arrangement of the thin layers structure being revealed in Raman spectra. The obtained results indicate that the annealing process has a significant influence on the structure of thin layers being under study.

Investigation of Si-Au vicinal surfaces using scanning tunnelling microscopy and reflection high-energy electron diffraction.

Silicon vicinal surfaces can be successfully used as substrates for the preparation of one-dimensional nanostructures. The quality of the structures prepared may be controlled using scanning tunnelling microscopy, as shown in this work. Additionally, it is possible to obtain valuable information using reflection high-energy electron diffraction. A typical way of employing reflection high-energy electron diffraction is to observe patterns of scattered electrons on a screen. However, it is possible to obtain more detailed information on the arrangement of atoms at the surface if azimuthal plots are collected. Azimuthal plots are measured by recording the intensity of specularly reflected electrons during the rotation of the sample around an axis perpendicular to its surface. So far, only flat surfaces have been examined in such a way. In this work, it is shown that such data, containing interesting features, can also be collected for vicinal surfaces.