High-performance silver-dielectric interference filters for RGBIR imaging.

New architectures of interference silver-dielectric multilayer filters inspired from induced transmission designs are investigated with the prospect of high-performance red-green-blue (RGB) complementary metal oxide semiconductor imaging. The optimized designs provide combined colorimetric, signal-to-noise ratio and sensitivity performances similar to the traditional organic color filters, but without the equirement of an external infrared (IR)-cut filter, which enables the integration of additional channels such as white or IR, in addition to RGB. Due to the sub-micrometer thickness of the stacks, this is a unique solution for fully integrated, high-performance multispectral filters patterned in very small pixels. The concept is demonstrated by a wafer-scale prototype with RGBIR filters patterned down to 1.4 µm adjacent pixels with up to 80% transmission.

Thin film characterization for modeling and optimization of silver-dielectric color filters.

We investigate the most appropriate way to optically characterize the materials and predict the spectral responses of metal-dielectric filters in the visible range. Special attention is given to thin silver layers that have a major impact on the filter's spectral transmittance and reflectance. Two characterization approaches are compared, based either on single layers, or on multilayer stacks, in approaching the filter design. The second approach is preferred, because it gives the best way to predict filter characteristics. Meanwhile, it provides a stack model and dispersion relations that can be used for filter design optimization.

Color filters including infrared cut-off integrated on CMOS image sensor.

A color image was taken with a CMOS image sensor without any infrared cut-off filter, using red, green and blue metal/dielectric filters arranged in Bayer pattern with 1.75 µm pixel pitch. The three colors were obtained by a thickness variation of only two layers in the 7-layer stack, with a technological process including four photolithography levels. The thickness of the filter stack was only half of the traditional color resists, potentially enabling a reduction of optical crosstalk for smaller pixels. Both color errors and signal to noise ratio derived from optimized spectral responses are expected to be similar to color resists associated with infrared filter.

Reconstruction method and optimal design of an interferometric spectrometer.

In this paper, we present a method to estimate the power spectral distribution of a source from input data acquired by an interferometric-based spectrometer. Our spectrometer shows distortions in the fringe pattern and a lack of data, making it impossible to apply the Fourier transform approach, which is the gold standard as a spectral recovery method for interferometric spectrometers. We combined linear inverse problem solving and iterative methods instead, considering that each detector of the spectrometer has a specific and known spectral response. Iterative methods are used to overcome problems caused by lack of input data. We show that a good spectral estimation of relatively simple spectra having a resolution of 400 points is typically achieved using fewer than 10 detectors with such a method. Since the quality of spectral restitution with such an approach relies both on signal processing and an optimal selection of the detector's spectral responses, the paper also shows that some sets of spectral responses selected for the detection and consequently a spectral repartition of the detectors are more successful than others in the spectral recovery process. We chose the condition number of the inversion matrix as an optimization criterion and evaluated how this criterion can be used within this framework. We found that maximizing it achieves better spectral restitution, within a range where noise remains low.

Multilayer structure for a spectral imaging sensor.

We investigate the possibility of recovering spectral information using a multilayer structure realized through microelectronics technologies and compatible with a matrix arrangement. The structure is made of photoabsorbing layers, acting as local photodetectors, alternating with transparent layers. The whole structure lies on a reflective surface. A stationary wave containing the spectral information of the source is generated within the structure. We determine the intensity of the stationary wave at any position, taking into account absorption and multireflections at each transition as well as the signal detected by the photoabsorbing layers. The model forecasting the detected signal is then validated using p-i-n diodes of different thicknesses made of hydrogenated amorphous silicon (a-Si:H) encompassed between indium tin oxide (ITO) electrodes. The detected signal depends on the wavelength of the incident light, the thickness of the detecting layer, and the latter's position within the structure. A specific spectral response can then be associated to each photoabsorbing layer. We show how spectral information can be retrieved from this kind of structure in the visible spectrum range.

Phase noise and phase modulation in optical coherence tomography.

The signal in optical coherence tomography is often modulated either in phase or by use of the Doppler modulation generated by a depth-scanning mechanism. The effect of each type of modulation on the signal's amplitude is evaluated. The advantages of each type of modulation in terms of immunity to phase noise and penetration depth are discussed in relation to two envelope detection schemes, i.e., lock-in detection and rms-to-dc conversion. Phase noise due to drifts and demodulation instabilities causes distortion of the signal envelope and can be responsible in part for the speckle appearance of the image.

Estimation of longitudinal resolution in optical coherence imaging.

The spectral shape of a source is of prime importance in optical coherence imaging because it determines several aspects of image quality, especially longitudinal resolution. Wide spectral bandwidth, which provides short coherence length, is sought to obtain high-resolution imaging. To estimate longitudinal resolution, the spectral shape of a source is usually assumed to be Gaussian, although the spectra of real sources are typically non-Gaussian. We discuss the limit of this assumption regarding the estimation of longitudinal resolution. To this end, we also investigate how coherence length is related to longitudinal resolution through the evaluation of different definitions of the coherence length. To demonstrate our purpose, the coherence length for several theoretical and real spectral shapes of sources having the same spectral bandwidth and central wavelength is computed. The reliability of coherence length computations toward the estimation of longitudinal resolution is discussed.