ABSTRACT
The combination of complementary measurement techniques has become a frequent approach to improve scientific knowledge. Pairing of the high lateral resolution scanning force microscopy (SFM) with the spectroscopic information accessible through scanning transmission soft x-ray microscopy (STXM) permits assessing physical and chemical material properties with high spatial resolution. We present progress from the NanoXAS instrument towards using an SFM probe as an x-ray detector for STXM measurements. Just by the variation of one parameter, the SFM probe can be utilised to detect either sample photo-emitted electrons or transmitted photons. This allows the use of a single probe to detect electrons, photons and physical forces of interest. We also show recent progress and demonstrate the current limitations of using a high aspect ratio coaxial SFM probe to detect photo-emitted electrons with very high lateral resolution. Novel probe designs are proposed to further progress in using an SFM probe as a STXM detector.
ABSTRACT
Metallic silver, copper, and Ag-Cu nanoparticles (NPs) have been produced by a chemical reduction method. The obtained nanoparticles were characterized by powder X-ray diffraction (XRD) and transmission electron microscopy (TEM). A side-segregated configuration was observed for the one-pot synthesized Ag-Cu NPs, and the melting temperature depression of about 14 °C was found by differential scanning calorimetry (DSC). A comparison between the new experimental data, the literature data on Ag-Cu bimetallic NPs and the corresponding theoretical values obtained from the Ag-Cu nano-sized phase diagram was done, whereas the melting behaviour of Ag and Cu metal nanoparticles was discussed in the framework of the liquid layer model (LLM).